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Near-infrared spectroscopy
01/2014:20240
2.2.40. NEAR-INFRARED
SPECTROSCOPY
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IT
SAMPLE PREPARATION/PRESENTATION
Sample preparation and presentation may vary according
to the measurement mode. The following requirements are
necessary for all sampling techniques :
optimise the measuring time and number of scans to
MEASUREMENT METHODS
optimise the signal-to-noise ratio ;
Transmission mode. Transmittance (T) is a measure of the
nd
the best suitable measurement mode for the
decrease in radiation intensity at given wavelengths when
intended application (transmission, diffuse reection or
radiation is passed through the sample. The sample is placed
transection) ;
in the optical beam between the source and the detector.
nd the best orientation of the sample (e.g. to minimise the
The arrangement is analogous to that in many conventional
impact of debossing on tablets) ;
spectrometers. The resulting spectrum can be presented
directly in terms of transmittance (T) and/or absorbance (A)
nd the best suitable accessory (e.g. transmission cell or
(y-axis) versus the wavelength or wavenumber (x-axis).
immersion probe) ;
optimise pathlength in transmission and transection
modes ;
nd a suitable spectroscopic background reference material ;
show that the background reference material is reliable
I0
= intensity of incident radiation ;
over time and that the measurement of the background is
I
reproducible and stable over time ;
= intensity of transmitted radiation ;
when measuring moving materials or samples (for
process-related measurements) it is important to obtain a
representative spectrum (e.g. by adjusting the measuring
time, the number of scans, co-adding individual spectra, or
increasing the beam size) ;
Diffuse reection mode. The diffuse reection mode gives
ensure there is no fouling of the sensor, for example with
a measure of reectance (R), the ratio of the intensity of
build-up of material or contamination ;
light reected from the sample (I) to that reected from a
background or reference reective surface (Ir). Depending on the measuring conditions (measuring time, beam size) in
the chemical composition and physical characteristics of the
relation to the minimal sample size should be justied.
sample, NIR radiation can penetrate a more or less substantial In some process analysis situations it may be impossible to
distance into the sample, where it can be absorbed by the
remove a probe for reference background data collection ;
overtones and combinations of the fundamental vibrations
various options are therefore to be considered, including
of the analyte species present in the sample. Non-absorbed
internal referencing, measurement of a background reference
radiation is partially reected back from the sample to the
using a 2nd detector, etc. Only spectra measured against a
detector. NIR reectance spectra are typically obtained
background possessing the same optical properties can be
by calculating and plotting log10 (1/R) (y-axis) versus the
directly compared with one another.
wavelength or wavenumber (x-axis).
Transmission mode. The measurement of transmittance (T)
is dependent on a background transmittance spectrum for its
calculation. Examples of background references include air,
a polymeric disc, an empty cell, a solvent blank or in special
cases a reference sample. The method generally applies to
I
= intensity of light diffusively reected from the
liquids (diluted or undiluted), dispersions, solutions and
sample ;
solids (including tablets and capsules). For transmittance
Ir
= intensity of light reected from the background or
measurements of solids, a suitable sample accessory is used.
reference reective surface ;
Liquid samples are examined in a cell of suitable pathlength
(typically 0.5-4 mm), transparent to NIR radiation, or
alternatively by immersion of a bre-optic probe of a suitable
conguration.
Diffuse reection mode. This mode generally applies to
solids. The sample is examined directly, or in a suitable device
Transection mode. This mode is a combination of
(for example a sample holder), or in direct contact with a
transmittance and reectance. In the measurement of
bre-optic probe. For process monitoring, material can be
transectance (T*), a mirror or a diffuse reectance surface
analysed through a polished window interface (e.g. sapphire),
is used to reect the transmitted radiation back through
or using an in-line bre-optic probe. Care must be taken to
the sample, thus doubling the pathlength. Non-absorbed
ensure that the measuring conditions are as reproducible as
radiation is reected back from the sample to the detector.
General Notices (1) apply to all monographs and other texts
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64
Reection
Transection
Transmission
Verification of
wavelength scale
(except for filter
apparatus)
Bench/mobile
instrument
Process instrument
If it is not practically possible to measure a traceable reference material at the point of sample measurement, use internal material
such as polystyrene, breglass or solvent and/or water vapour. Alternatively, adopt a second external channel/probe.
For FT instruments, the calibration of the wavenumber scale may be performed using a narrow, isolated water-vapour line, for
example, the line at 7306.74 cm 1, or 7299.45 cm 1, or 7299.81 cm 1 or a narrow line from a certied reference material.
Verification
of wavelength
repeatability (except
for filter apparatus)
The standard deviation of the wavelength is consistent with the specications of the instrument manufacturer, or otherwise
scientically justied.
Bench/mobile
instrument
Process instrument
Verification of
photometric linearity
and response stability(1)
Bench/mobile
instrument
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Measurement mode
Reection
Transection
Transmission
Process instrument
If photometric reectance and transmittance standards cannot be measured at the point of sample measurement, use the
photometric standards built into the instrument.
Process instruments can use internal photometric standards for photometric linearity. Follow the manufacturers veried
tolerances in such cases.
Verification of
photometric noise(1)
Determine the photometric noise at a relevant photometric region of the spectrum using a suitable reectance standard, for
example, white reective ceramic tiles or carbon-doped polymer standards. Follow the manufacturers methodology and
specications.
Bench/mobile
instrument
Scan the reectance low ux standard (e.g. 5 or 10 per cent, carbon-doped polymer
standard) over a suitable wavelength range in accordance with the manufacturers
recommendation and calculate the photometric noise as peak-to-peak noise.
Process instrument
As above, or if not practically possible, use the standard built into the instrument
for noise testing and manufacturer specications.
Verification of photometric linearity and Verification of photometric noise are not required for instruments using methods to perform simple
identications which do not use the photometric absorbances as part of model strategy (for example, simple correlation with absorbing wavelengths).
(1)
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QUANTITATIVE ANALYSIS
L
R
Molar ellipticity :
Pre-treatment of data. Wavelength selection or excluding
Certain types of instruments display directly the value of
certain wavelength ranges may enhance the accuracy and
ellipticity , expressed in degrees. When such instruments
robustness of calibration models. Wavelength compression
(wavelength averaging) techniques may be applied to the data. are used, the molar ellipticity [] may be calculated using the
following equation :
Model validation parameters. Analytical performance
characteristics to be considered for demonstrating the
validation of NIR methods are similar to those required for
any analytical procedure. Specic acceptance criteria for each
[] = molar ellipticity, expressed in
validation parameter must be consistent with the intended
degreescm2decimole 1,
use of the method. Validation parameters for quantitative
methods are accuracy, linearity, precision (repeatability and
67