Professional Documents
Culture Documents
CONTROL (SPC)
BASIC CONCEPTS
OF
SPC
By
A R SURESH
CONTENT
1.INTRODUCTION
2.PROCESS CONTROL
3.VARIATION
4.CAUSES
5.STATISITICAL CONTROL
6.TOOLS FOR STATISTICAL CONTROL
7.PROCESS CAPABILITY
8.PROCESS CAPABILITY INDICES
9.CONTROL CHART TYPES
10 CONTROL CHART MEHODOLOGY EVALUATION
Vs
CONFORMANCE TO
SPECIFICATION
07/29/09 SPC CM NNCPL 3
WHAT SPC MEANS?
SPC is not constrained to measuring the Conformance; it is intended
to lead to action on processes, which are operating within the
“specification” to minimize variability. It can be used to analyze a
process or its output, so as to take appropriate actions to achieve and
maintain a state of Statistical Control and to Improve the Process
Capability. It provides objective means of controlling quality in any
transformation process, whether used in the manufacture of articles,
the provision of services or the transfer of Information. Tools of SPC’s
are not calendars / sceneries to hang it on the wall of the industries
where it is made. It should be used as Component part of company-
wide adoption of ‘TOTAL QUALITY’ and act as tool for a never-ending
improvement.
SPC exists because there is, and will always be variation in the
characteristic of materials, articles, services, people present.
Variation has to be understood and assessed in order to be managed.
SPC can be carried out through “control charts”.
07/29/09 SPC CM NNCPL 4
PROCESS CONTROL
THREE TYPES OF PROCESS CONTROL
• PREVENTION OF DEFECTS
* MISTAKE/ERROR PROOFING
• DETECTION OF CAUSES AND LEAD TO
CORRECTIVE ACTION
* VISUAL CONTROL, SPC
• DETECTION OF DEFECTS
* INSPECTION
· 10 % IS STATISTICS
• SAMPLE –1
15,15,14,15,16,15,15
MEAN: 105 / 7 = 15, RANGE: 16 – 14 = 2
• SAMPLE –2
14,15,20,15,16,10,15
MEAN: 105/7 = 15, RANGE : 20 – 10 = 10
• SAMPLE - 3
19,20,15,14,11,10,16
MEAN: 105 / 7 = 15, RANGE : 20 – 10 = 10
SAMPLE 2:
MEAN/AVERAGE (X bar) = 15, RANGE (R) = 10,
STANDARD DEVIATION (σ) = 2.726
SAMPLE 3:
MEAN/AVERAGE (X bar) = 15, RANGE (R) = 10,
STANDARD DEVIATION (σ) = 3.464
CAUSES OF VARIATION
• COMMON OR CHANCE CAUSES
• SPECIAL OR ASSIGNABLE CAUSES
IMPORTANT NOTE
The changes in the process distribution due to special causes can be
either detrimental or beneficial. When detrimental, they need to be
understood and removed. When beneficial, they should be
understood and made a permanent part of the process.
PROCESS CAPABILITY
Cp=Potential Process Capability Index
Cp = Tolerance / Total Variation (6 Sigma)
1. GATHER DATA
2. INITIAL STUDY
3. CALCULATE CONTROL LIMITS
4. INTERPRET FOR PROCESS CONTROL
5. INTERPRET FOR PROCESS CAPABILITY
6. ESTABLISH ONGOING CONTROL CHART
7. MONITOR, REVIEW AND IMPROVE
PROCESS CAPABILITY
SPC
By
A R SURESH
R bar =MEAN R = 6.488 UCL R = D4*R bar = 13.63 LCL R=D3*R bar=0 RANGE CHART
D/T 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25
AD
IN
SUM
AVG
RNG
07/29/09 SPC CM NNCPL 46
SCALE FOR PLOTTING: FOR X BAR CHART 0.80/DIVISION, FOR R CHART 1.40/DIVISION:
Questions on reaction yield problem.
1 2 3 4 5 6 7 8 9 1 1 1 1 1 1 1 1 1 1 2 2 2 2 2 2 i Sum
i-date 0 1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 =25
Time
ni Sample 5k 5k 5k 5k 5k 5k 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 5 ni sum
Size k k k k k k k k k k k k k k k k k k k 12500
Pi prpn of 24 30 38 26 18 52 3 2 3 3 3 4 2 6 3 2 3 3 4 3 1 2 2 3 3
NC μ μ μ μ μ μ 6 8 4 6 2 8 2 2 2 0 2 4 0 0 6 6 4 4 6
μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ
P bar = nPi sum/ni sum = 405/12500 = 0.0324, UCLP & LCLP = 0.0324 + & - [3 x Sq root{0.0324 x 0.9676/500}] = 0.0324 + & - 0.0237 = 0.0561 &
0.0087, Process Capability CPk = (1-P bar) = 1-0.0324 = 0.9676 = 96.76 % (Scale 0.0012 per division & 0.006 per 5 for plotting).
P chart analysis for variation: 1) beyond Control Limits – Evidence of instability at that point because of Spl causes ,calling for analysis &
review. 2) Beyond UCL –not good – control is not proper – plotting may be wrong – process Perf worsened – Measurement system & or
operator changed. 3) beyond LCL – good – process Perf improved – to be studied for further implementation - Measurement system & or
operator changed.
1 2 3 4 5 6 7 8 9 1 1 1 1 1 1 1 1 1 1 2 2 2 2 2 2 i Sum
i-date 0 1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 =25
Time
ni Sample 96 12 80 14 13 99 1 1 1 5 1 1 1 1 1 2 1 9 1 1 3 1 1 1 1 ni sum
Size 8 16 4 01 76 5 2 0 1 4 3 0 7 3 1 3 3 7 0 2 9 4 2 3 1 29858
0 2 8 2 2 6 2 0 9 0 6 3 5 4 2 3 2 5 8
2 8 4 5 6 1 5 0 6 5 8 4 3 5 2 7
Pi prpn of 8μ 11 16 10 15 1 1 2 3 1 1 1 7 1 4 1 5 1 1 2 1 1 1 1
NC μ μ 11 μ μ 1 0 0 3 2 6 1 μ 2 μ 0 μ 4 5 6 2 1 1 8
μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ
n bar =29858/25 = 1194, P bar = nPi sum/ni sum = 356/29858 = 0.012, UCLP & LCLP = 0.012 + & - [3 x Sq root{0.012 x 0.988/1194}] = 0.012 + & - 0.0095 =
0.0215 & 0.0025, Process Capability CPk = (1-P bar)
= 1-0.012 = 0.9880 = 98.80 % (Scale 0.0005 per division & 0.0025 per 5 for plotting).
P chart analysis for variation: 1) beyond Control Limits – Evidence of instability at that point because of Spl causes ,calling for analysis & review. 2) Beyond
UCL –not good – control is not proper – plotting may be wrong – process Perf worsened – Measurement system & or operator changed. 3) beyond LCL –
good – process Perf improved – to be studied for further implementation - Measurement system & or operator changed.
1 2 3 4 5 6 7 8 9 1 1 1 1 1 1 1 1 1 1 2 2 2 2 2 2 i Sum
i-date 0 1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 =25
Time
ni 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 ni sum
Sample 25
Size
nPi No 9 15 11 8 17 11 5 1 1 7 1 1 4 3 7 2 3 3 6 2 7 9 1 5 8 nPi
of NCs 1 3 0 2 sum
189
C bar = nPi sum/i sum = 189/25 = 7.56, UCLC & LCLC = 7.56 + & - 3 x Sq root 7.56 = 7.56 + & - 8.25
= 15.81 & 0 (ignore negative value -0.69& make it 0), Process Capability CPk = (100-C bar) = 100-7.56
= 92.44 % (Scale 0.4 per division & 2.0 per 5 for plotting). As LCL is 0, C bar line (as bold line) can be referred for any action for correction or
improvement.
C chart analysis for variation: 1) beyond Control Limits – Evidence of instability at that point because of Spl causes, calling for analysis &
review. 2) Beyond UCL –not good – control is not proper – plotting may be wrong – process Perf worsened – Measurement system & or
operator changed. 3) Beyond LCL – good – process Perf improved – to be studied for further implementation - Measurement system & or
operator changed.
1 2 3 4 5 6 7 8 9 1 1 1 1 1 1 1 1 1 1 2 2 2 2 2 2 i Sum
i-date 0 1 2 3 4 5 6 7 8 9 0 1 2 3 4 5 =25
Time
ni 62 62 62 62 62 62 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 6 NA
Sample 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2
Size
nPi No 2 5 4 3 3 6 5 0 7 5 4 1 2 3 6 3 8 4 4 4 6 4 2 3 7 nPi
of NCs sum
101
nP bar = nPi sum/i sum = 101/25 = 4.04, P bar = nP bar/ni = 4.04/62 = 0.0652, UCLP & LCLP = 4.04 + & - [3 x Sq root{4.04 x 0.9348} = 4.04 + &
- 5083 = 9.87 & 0 (ignore negative value & make it 0), Process Capability CPk = (1-P bar) = 1-0.0652 = 0.9348 = 93.48 % (Scale 0.22 per
division & 1.1 per 5 for plotting).
nP chart analysis for variation: 1) beyond Control Limits – Evidence of instability at that point because of Spl causes ,calling for analysis &
review. 2) Beyond UCL –not good – control is not proper – plotting may be wrong – process Perf worsened – Measurement system & or
operator changed. 3) beyond LCL – good – process Perf improved – to be studied for further implementation - Measurement system & or
operator changed.
1 2 3 4 5 6 7 8 9 1 1 1 1 1 i Sum
i-date 0 1 2 3 4 = 14
Time
ni 8 8 9 8 8 7 7 8 8 8 7 8 9 9 ni sum
Sample 112
Size
nPi No 8 17 18 15 23 9 1 6 1 1 1 1 1 2 nPi
of NCs 9 4 7 3 5 6 2 sum
212
Pi prpn 1. 2. 2. 1. 2. 1.3 2. 0. 1. 2. 1. 1. 1. 2.
of NC 0 1 0 9 9 7 8 8 1 9 9 8 4
n bar =112/14 = 8, U bar = nPi sum/ni sum = 212/112 = 1.89, UCLU & LCLU = 1.89 + & - [3 x Sq root{1.89/8}] = 1.89 + & - 1.46 = 3.35 & 0.43,
Process Capability CPk = (100-U bar) = 100 – 1.89 = 98.11 % (Scale 0.08 per division & 0.4 per 5 for plotting).
U chart analysis for variation: 1) beyond Control Limits – Evidence of instability at that point because of Spl causes ,calling for analysis &
review. 2) Beyond UCL –not good – control is not proper – plotting may be wrong – process Perf worsened – Measurement system & or
operator changed. 3) beyond LCL – good – process Perf improved – to be studied for further implementation - Measurement system & or
operator changed.