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Article history: Microfluidic architectures for lab-on-a-chip applications are often made of polydimethylsiloxane (PDMS), a
Received 20 September 2010 polymeric material easy to use, cheap and widely compatible with biomaterials but with a low stability to-
Received in revised form 23 September 2011 wards organic solvents. Its chemical resistance can be increased by covering the channel walls with relatively
Accepted 24 September 2011
stable films. In this perspective, fluoropolymers are a class of interesting materials due to their inertness
Available online 2 October 2011
properties. In this work we prepared coatings of fluoropolymers on PDMS and we characterized them by
Keywords:
Quartz Crystal Microbalance, Atomic Force Microscopy, and contact angle. The swelling tests performed
PDMS gave a proof of their application for increasing PDMS stability towards organic solvents. The incorporation
Fluoropolymers of fluoropolymers into PDMS microchannels was also demonstrated.
Teflon © 2011 Elsevier B.V. All rights reserved.
Microfluidics
0040-6090/$ – see front matter © 2011 Elsevier B.V. All rights reserved.
doi:10.1016/j.tsf.2011.09.063
2294 V. Arima et al. / Thin Solid Films 520 (2012) 2293–2300
2.1. Fabrication of PDMS molds A sensor crystal with Au surface (Q-sense E1, Q-Sense, Göteborg,
Sweden) was coated with a thin layer of PDMS polymer. The crystal
Sylgard-184, a two-part poly(dimethylsiloxane) (PDMS) elasto- was initially cleaned by oxygen plasma treatment, then Sylgard-184 di-
mer, was purchased from Dow Corning (USA). PDMS substrates luted in toluene (0.5 wt.%) was spun-coated on the crystal and allowed
were fabricated by mixing base and curing agent in 10:1 weight to polymerize at 140 °C for 15 min. After determining PDMS thickness
ratio. The base and curing agent were mixed and degassed until all in air, silane and Teflon were deposited according to the procedure
air was removed in a sonicator. Defined amounts of prepolymer reported above for samples PDMSfs and PDMStf. Their thicknesses
were poured onto Petri dishes and polymerized at 140 °C for were evaluated by a comparison between bare PDMS, PDMSfs and
15 min. Many samples of dimensions 1 × 1 cm 2 and 0.3 mm thick PDMStf samples by QCM in air. The reported thickness values are an av-
were cut for performing AFM and contact angle experiments. erage over three (3, 5, 7) overtones of each measurement and the errors
are calculated as standard deviation.
2.2. Fabrication of Teflon coated PDMS molds
2.4. Atomic Force Microscopy measurements
A number of PDMS samples were produced and different functionali-
zation procedures were developed in order to prepare Teflon coated sam- Morphological features of PDMS samples were characterized by
ples and explain the origin of their main morphologic features (see Fig. 1). AFM in tapping mode (Nanoscope IIIa, Veeco, USA) using silicon can-
tilevers (model RFESPA) with a tip radius of 8 nm and a resonance
2.2.1. PDMSpl samples frequency of 70–85 kHz. The reported values of crack height, width,
After their preparation, PDMS molds were introduced into a com- peak-to-peak distance as well as wave amplitude, height and distance
mercial atmospheric plasma generator (Diener, Pico, low pressure between adjacent waves are an average over tens of measurements
plasma system) to induce oxygen plasma (at 50 W for 80 s), therefore acquired on different areas of the samples. The errors were calculated
modifying the PDMS surface properties. as standard deviations from the medium value.
Fig. 1. Functionalization scheme of PDMS samples. Some PDMS samples were treated sequentially with: (a) oxygen plasma producing PDMSpl samples; (b) 1H,1H,2H,2H-Perfluor-
ooctyltriethoxysilane resulting in PDMSfs samples; (c) with Poly[4,5-difluoro-2,2-bis(trifluoromethyl)-1,3-dioxole-co-tetrafluoroethylene] producing PDMStf samples.
V. Arima et al. / Thin Solid Films 520 (2012) 2293–2300 2295
was injected at 400 μl/min for 2 h. After drying the samples, the thick- chemical inertness, Teflon AF has a limited solubility also in fluorinat-
ness measurement in air was repeated. The same procedure was per- ed solvents; therefore the most concentrated solution obtained by
formed washing the crystal at 800 μl/min and at 1200 μl/min for 2 h. dissolving under stirring Teflon AF beads in fluorinert was 2 wt.%
Other experiments were carried out to verify if the treatment with and the whole procedure lasted some days at 50 °C. Two more diluted
toluene weakens the interaction between PDMS and Teflon. After solutions were also prepared (0.2 wt.% and 1 wt.%) and depositions of
evaluating mass weight in air, the QCM crystal covered with a layer the three solutions were performed at different spinning rates (1000,
of PDMS2tf2000 was put in contact with toluene as described in Sec- 1500, 2000, 4000 RPM) with the aim of producing thick, reproducible
tion 2.6. After the swelling treatment, it was inserted into the QCM and stable coatings.
cell and sample mass evaluated in air. Then water was injected at
400 μl/min for 2 h. After drying the samples, the mass measurement 3.1. Surface wettability modifications during functionalization
in air was repeated. The same procedure was performed washing
the crystal at 800 μl/min and at 1200 μl/min for 2 h. We initially follow the modifications that occurred at macroscale
on such materials after steps a, b and c of Fig. 1 (Table 1) using contact
2.8. Device fabrication and characterization angle measurements. As expected, the contact angle value, typical of
hydrophobic no-treated PDMS, is promptly decreased by plasma
PDMS devices consist of two moieties: a relatively thin one con- treatment and then gradually increased after perfluorooctyltriethoxy-
taining microchannels and another one, thicker than the previous silane and Teflon AF deposition. On PDMSfs samples, perfluorosilanes
one, with punched holes. The microchannels have a serpentine geom- assemble in the form of multilayers in which Si–O groups and fluori-
etry and are 300 μm wide and 50 μm deep. The PDMS chips were fab- nated chains are randomly oriented. The alternation of domains of
ricated using an elastomer PDMS kit (Sylgard-184, Dow Corning, different hydrophobicity originates on average a limited hydrophobic
USA). The Sylgard-184 mixtures were prepared at a mass ratio of surface. The arrangement in the form of multilayers justifies the dis-
10:1 and poured on a SU-8 mold fabricated by optical lithography. A crepancy between the contact angle values reported in previous
layer of 50 μm was deposited on a silicon substrate and cured at works for fluorinated surfaces [28] (related to monolayers of fluori-
65 °C for 3 min and 95 °C for 6 min. After the PDMS pouring on the nated silanes) and the one reported in Table 1 for PDMSfs samples.
mold, the PDMS mixture was subsequently cured at 140 °C for Teflon AF definitively modifies the wettability properties, strongly in-
15 min to cross-link the polymers. Another flat PDMS mold of 5 mm creasing the water repellent behavior [29]. For the prepared samples
thickness was produced with the same procedure and 2 holes were we measured values between 100 and 125° (Table 1).
punched with biopsy punchers of 2 mm diameter to be used as inlets
and outlet. 3.2. Thickness evaluation: QCM measurements
A commercial atmospheric plasma generator was employed to in-
duce oxygen plasma and consequently modify the PDMS surface The coating thicknesses were calculated using a Quartz Crystal Mi-
properties. crobalance with a dissipation (QCM-D) instrument from Q-Sense. The
The PDMS microchannels and the flat cover were then sealed by dissipation signal provides insights about the viscoelastic properties of
sticking the two plasma-treated substrates together. the absorbed layers [30–32]. Meaningful fluctuation of dissipation sig-
After preparation of the PDMS device, silane/Teflon coatings were nal means that the material is soft and that Sauerbrey equation under-
introduced by injection via syringe pumps. In more detail, soon after estimates the mass [33]. Therefore, after checking that there were no
oxygen plasma treatment and sealing, holes were glued to PEEK/ relevant dissipation variations for PDMS, PDMSfs, and PDMStf samples,
fused silica tubings (PEEKsil tubings from IDEX 1/32 in. O.D., 25 μm Sauerbrey equation was used to fit the data, setting PDMS and silane
I.D.) and connected to a syringe pump (Kd Scientific, Model 200 densities at 1023 kg/m 3 [34] and Teflon density at 2160 kg/m3. The
Series). thicknesses of the PDMS and of the silane deposited on the gold quartz
Pure perfluorooctyltriethoxysilane was injected into the PDMS crystals were evaluated to be 21± 1 nm and 5 ± 1 nm respectively. In
microchannels at 10 μl/min flow rate. The surface chemical modifica- the case of homogenous coatings, the results obtained from different
tion was achieved after removing the residual silane solution from overtones are expected to be roughly comparable. This effect was ob-
the microchannels with the syringe pumps. This injection was fol- served in the case of samples 3–7 reported in Table 2 in bold. For sam-
lowed by a bake at 90 °C for 10 min. Subsequently a solution com- ples 1, 2 and 8 error values higher than 10% were found (Table 2);
posed of Teflon AF (0.2 wt.%) and fluorinert FC70 (99.8 wt.%) was this strange behavior would suggest that a not so homogenous and
introduced into the silane functionalized microchannels (as described compact layer was deposited in such conditions.
above) and three consecutive bakes at a) 100 °C for 10 min, b) 150 °C The hypotheses of the different superficial arrangement of the Tef-
for 10 min and c) 250 °C for 15 min were carried out. The presence of lon films were verified by optical inspection, AFM and contact angle
the coating inside the microchannels was verified by Scanning Elec- studies.
tron Microscopy (SEM) (Raith 150) after cutting the device in cross
and evaporating a Au layer of 5 nm. 3.3. Morphology and wettability of PDMStf samples: optical inspection,
AFM and contact angle measurements
3. Results and discussion
Optical images and typical AFM morphologies of the investigated
The functionalization process used for the preparation of PDMStf samples are shown in Fig. 2. The presence of a thick film on the PDMS
samples is summarized in Fig. 1. PDMS coatings were prepared after surface is clearly visible for samples 4–8, (Teflon thickness≥ 100 nm),
activation of the surface by oxygen plasma (PDMSpl samples). This being characterized by waves at macroscale (Fig. 2a). In the case of thin-
process allows the introduction of hydroxyl groups on the PDMS sur- ner Teflon layers (samples 1–3), the morphology seems to be more sim-
face to be used for anchoring the perfluorinated silanes (PDMSfs sam- ilar to bare plasma-PDMS samples (Figs. 2b and 4).
ples). In PDMStf samples, among the perfluorinated side chain of the
silane and the fluoropolymer, fluorophilic interactions take place. Table 1
They are believed to be strong enough to increase the adhesion of Contact angles of PDMS, PDMSpl, PDMSfs and PDMStf samples.
the Teflon layer on PDMS given that fluorophilic interactions have PDMS PDMSpl PDMSfs PDMStf
been demonstrated to drive the self-assembly of block copolymer as
115 ± 7 25 ± 3 61 ± 7 100–125
well as phase segregation phenomena [25–27]. Because of its
2296 V. Arima et al. / Thin Solid Films 520 (2012) 2293–2300
Sample number Sample name Thickness (nm) In order to explain the two different morphologies of Teflon on
PDMS (shown in Fig. 2c–d), we first compared the AFM images (see
1 PDMS0.2tf2000 …
2 PDMS1tf4000 49 ± 14 Fig. 3) of the produced samples (PDMS, PDMSpl, PDMSfs, PDMS0.2tf2000
3 PDMS1tf2000 34 ± 1 and PDMS2tf2000).
4 PDMS1tf1000 107 ± 4 PDMS is a very interesting material for microdevices, but its sur-
5 PDMS2tf4000 107 ± 3
face is easily modified by common fabrication processes such as plas-
6 PDMS2tf2000 204 ± 2
7 PDMS2tf1500 234 ± 6 ma and annealing treatments [21]. Untreated PDMS (Fig. 3a) doesn't
8 PDMS2tf1000 713 ± 80 exhibit particular structures resulting in a rms of 0.2 ± 0.1 nm. After
the oxygen plasma treatment (PDMSpl sample, see Fig. 3b) repeated
cracks of 58 ± 21 nm height, 700 ± 100 nm width and tens of micro-
AFM image of Fig. 2c shows a homogenous layer of Teflon that meters length, appear on the surface. The same morphology seems
covers PDMS surface. This image was acquired on PDMS2tf2000 sam- to characterize PDMSfs samples (Fig. 3c) being the silane layer only
ples but we observed similar morphologies for samples thicker than a thin homogenous coating on PDMS (as also QCM studies suggest).
100 nm. A more detailed study on the morphology of these layers is On PDMS0.2tf2000 samples (Fig. 3d) Teflon AF assembles in the form
reported in Section 3.4. Samples 1–2 show the morphology reported of circular nanostructures with average height and diameter of respec-
in Fig. 2d. Since we observed Teflon islands on the background tex- tively 48 ± 12 nm and 120 ± 30 nm. The structures seem to decorate
ture due to the thermal treatment of PDMSpl samples (full explana- the PDMSfs samples with an average density of 10 particles/μm2 but ad-
tion in the next paragraph), and we acquired a very unstable QCM ditional features are also generated in the form of periodic waves. The
signal, we believe that such samples are not compact enough to effi- peak-to-peak distance between two waves and the amplitude of these
ciently shield PDMS from toluene adsorption. On the contrary, no Tef- waves are respectively of 590 ± 30 nm and 44 ± 7 nm.
lon islands were observed in AFM images of sample 3 (morphology Waves disappear if a thick and homogenous layer of Teflon AF
similar to bare annealed PDMSpl samples of Fig. 4c), thus suggesting (PDMS2tf2000) is spun coated on PDMSfs. As Fig. 3e shows, Teflon AF
the presence of a thin Teflon layer on PDMS. seems to be, in this case, uniformly deposited on PDMSfs and only repeat-
The theory of a less compact layer for samples 1–2 and of a ho- ed cracks, attributed to the plasma treatments (see Fig. 1b), are still
mogenous thin layer for sample 3 was also supported by contact visible.
angle measurements. Observing the results listed in Table 3 and the Therefore, Teflon islands, formed at low concentration, are
low surface coverage of teflon particles (Fig. 2d), it is clear that the replaced by a uniform layer. The film of Fig. 3e shows more pro-
wettability is strongly influenced by the properties of the underlying nounced cracks probably because defects act as nucleation sites
silane layer. The contact angle values of samples 1–2, hence, derive from which the film starts growing.
from an average of silane and Teflon wettability properties. Sample In order to explain the origin of the features (essentially cracks and
3 has a contact angle value equal to samples 5–7 that confirms the waves) shown in Fig. 3b–e, we prepared some PDMS samples to observe
presence of a homogenous Teflon coverage. The higher error values the effect induced by only plasma (PDMSpl) and both plasma/annealing
reported for samples 1 (Table 3) once again suggest that samples 1– processes (PDMSan), necessary to prepare PDMStf surfaces. Images and
2 are less homogenous than sample 3–7 as documented by the AFM line profile of such samples are shown in Fig. 4. From a comparison be-
images of Fig. 2. tween PDMSpl, PDMSan and PDMStf samples, it clearly appears that
Fig. 2. Optical images of (a) sample 6 and (b) sample 1 of Table 2. AFM images of (c) sample 6 of Table 2 over an area of 30 × 30 μm2 and (d) of sample 2 of Table 2 over an area of
10 × 10 μm2.
V. Arima et al. / Thin Solid Films 520 (2012) 2293–2300 2297
Table 3 fractures) because of etching and local heating effects. The weak ther-
Thickness, contact angles and swelling ratio of PDMS and PDMStf samples in toluene. mal expansion due to the temperature increase is supposed not to be
Sample number Sample name Thickness Contact angle Swelling ratio so powerful to form high amplitude waves. The following annealing
treatments are, however, strong enough to generate waves orientated
– PDMS – 115 ± 7 2.6% ± 0.4%
1 PDMS0.2tf2000 Teflon islands 111 ± 11 1.7% ± 0.3% perpendicularly to defects, the plasma-induced cracks, in this case
3 PDMS1tf2000 34 ± 1 122 ± 4 1.7% ± 0.3% [35]. It is also known that more a bigger thickness of the top silica
5 PDMS2tf4000 107 ± 3 122 ± 2 1.6% ± 0.3% layer (due to stronger plasma dose) determines closer waves [34].
6 PDMS2tf2000 204 ± 2 122 ± 1 0.8% ± 0.1%
Teflon AF on PDMS increases the thickness of the hard layer on the
7 PDMS2tf1500 234 ± 6 124 ± 1 1.8 ± 0.1%
top of bulk PDMS and therefore it is expected to affect the wave for-
mation after annealing. From the comparison (Table 4) between the
plasma treatment generates regular patterns on PDMS (as it can be seen structures (cracks and waves) of PDMSpl, PDMSan and PDMS0.2tf2000
in the optical image of Fig. 4a) creating cracks with repeatable height samples it comes up that the Teflon addition has the effect of produc-
and width (Table 4). Each crack usually exhibits double peak features ing smaller and higher density waves (see Table 4).
(see Fig. 4d) whose depth seems to be in the hundreds of nm range. In the case of a thick Teflon layer (PDMS2tf2000 samples) the film
The entire PDMS surface is visibly damaged by these cracks. Although deposition increases the crack dimensions but nothing can be con-
this treatment generates discontinuities in the usually so homogeneous cluded about its influence on the wave formation process probably
PDMS surface, it is necessary to introduce the desired functionalities. being the silica-like layer of very low thickness (considering the ap-
Occasionally, higher resolution images (Fig. 4b) show some waves plied plasma dose it is expected to be in the range of tens of nm
perpendicularly oriented with respect to the cracks whose distance be- [35]) compared with the 200 nm Teflon multilayer. We believe that
tween adjacent waves and amplitude are respectively 1070±30 nm the 2% Teflon solution which is more viscous than the 0.2% one, is eas-
and 0.3±0.1 nm. The annealing treatment up to 300 °C, used after 0.2% ily trapped during the spin coating process in the crack areas. In the
Teflon AF deposition, determines clearly visible waves, perpendicular to area of the sample far from the cracks, less solution is deposited. As
the cracks, characterized by a distance (between the peaks of adjacent consequence, the film appears thicker in proximity of the cracks in
waves) of 820±60 nm and a height of 57±4 nm (Fig. 4c). The appear- PDMS2tf2000 samples.
ance of both these features is explained by Whitesides's theory on ther-
mal stress [35]. It seems that oxygen plasma treatment produces a
hydrophilic silica-like layer on PDMS surface, harder than the bulk one. 3.5. Swelling behavior
It was demonstrated that waves perpendicularly oriented to defects are
formed when PDMS is heated at temperatures between 50° and 250 °C To give a proof of the PDMS swelling reduction due to the depos-
for more than 45 min. Actually, while PDMS is thermally expanded, plas- ited Teflon coatings, a measure of swelling ratio [4,5] was experimen-
ma oxidation forms a relatively incompressible layer that has a lower co- tally obtained using toluene, a very aggressive solvent for PDMS. As
efficient of thermal expansion than the unoxidized, bulk PDMS. Therefore detailed in the Section 2, only the PDMS surface was in contact with
the surface oxide layer is placed under compressive stress when PDMS the solvent. The swelling ratio S was determined by the formula: S
cools down at room temperature and contracts. As a consequence, the (%) = {(W − W0)/W0} ∗ 100, where W is the sample weight after dry-
surface buckles into a pattern of waves to relieve the stress. In proximity ing and W0 is the weight prior to exposure to the solvent. The S values
of cracks, the stress perpendicular to the step is relieved by expansion. are given in Table 3 for samples with Teflon islands and covered with
It is also known that the presence and the density of the waves are films of thickness between 34 and 234 nm.
a function of the top layer thickness and therefore proportional to the The results show an appreciable reduction of the PDMS swelling
applied plasma dose [21]. ratio for samples 1–2 functionalized with Teflon islands and thin
In PDMSpl samples the plasma treatment generates the hard films up to 100 nm (sample 5). A 3-fold reduction was found for sam-
silica-like layer and partially damages it (generating patterns of ple 6.
Fig. 3. AFM images over an area of 10 × 10 μm2 of PDMS samples (a) untreated, (b) plasma treated (PDMSpl), (c) silane functionalized (PDMSfs), (d) treated with a 0.2 wt.% Teflon
AF solution at 2000 RPM (PDMS0.2tf2000) and (e) treated with a 2 wt.% Teflon AF solution at 2000 RPM (PDMS2tf2000).
2298 V. Arima et al. / Thin Solid Films 520 (2012) 2293–2300
Fig. 4. (a) Optical image of PDMSpl samples; (b) AFM image of a PDMSpl sample over an area of 10 × 10 μm2; (c) AFM image of a PDMSan sample over an area of 30 × 30 μm2; (d)
line profile along the line shown in (c) and labeling of waves and cracks.
Surprisingly, sample 7 was less efficient than sample 6 in shielding amplitude and, consequently, the rms of the surface decrease, the en-
from toluene adsorption. We suspect that Teflon adhesion could de- tire structure of the waves collapses.
crease with thickness increase after a certain threshold value. The same behavior is also visible in the case of PDMS0.2tf2000 sam-
Considering these results, we focused on 200 nm coatings ples: wave height decreases and Teflon nanostructures become larger
(PDMS2tf2000) to demonstrate their time stability, their resistance to me- and flatter, not easily differentiable from the waves. Crack shape and
chanical stress induced by liquid injection at moderate flow and finally to dimensions appear rather unmodified.
develop a procedure to incorporate them in PDMS microfluidic devices. In the case of PDMS2tf2000 samples we observed that the crack
height decreases, but no considerations related to wave evolution can
3.6. Stability over the time: AFM, contact angle and swelling measurements be done being the PDMS surface completely covered by a thick Teflon
AF layer.
Considering the swelling tests, 200 nm Teflon coatings appear satis- In order to compare the observed phenomena for the three samples,
fying enough to be chosen to be implemented into a real functional de- we analyzed the line profiles extrapolated from AFM images of cracks
vice. One point to be investigated before developing a deposition and waves. The parameters chosen to quantify the structural variations
method to introduce Teflon coatings inside PDMS microchannels is the are essentially wave height for samples PDMSan and PDMS0.2tf2000
stability of the morphological, wettability and swelling properties dur- (being crack height less influenced by aging effects) and crack height
ing the time, being well known the dynamic nature of PDMS [36–39]. for PDMS2tf2000 (being waves not visible in this case). We reported
The evolution over the time of 200 nm Teflon coated PDMS was the time scale corresponding to a height reduction of 30% for each sam-
monthly monitored by AFM. ple. These results are summarized in Table 4. Wave height decreases of
For comparison we also followed aging effects of samples PDMSan 30% after 6 months in the case of PDMSan and after 4 months for
and PDMS0.2tf2000. PDMS0.2tf2000. PDMS2tf2000 shows a reduction of 30% of crack height
From AFM images of PDMSan samples (not reported) at different but, unluckily, a direct comparison with PDMSan was not possible.
time points, it seems that crack shape is essentially the same but Compared with PDMSan samples, PDMS0.2tf2000 surfaces become
waves appear smaller and their density unchanged. The wave “flatter” earlier or at least the process appears more visible on them,
Table 4
Characteristics of the main features observed in AFM images of Figs. 2–4, along the line profiles shown in Fig. 4c of PDMSpl, PDMSan, PDMS0.2tf2000 and PDMS2tf2000 samples.
PDMSpl 1070 ± 30 0.3 ± 0.1 1.3 ± 0.3 400 ± 100 58 ± 21 700 ± 100 –
PDMSan 820 ± 60 57 ± 4 61 ± 1 700 ± 200 78 ± 6 1400 ± 200 6
PDMS0.2tf2000 590 ± 30 44 ± 7 43 ± 4 200 ± 100 50 ± 12 800 ± 100 4
PDMS2tf2000 – – – 400 ± 200 620 ± 85 1500 ± 100 6
a
Estrapolated from a line profile perpendicular to the cracks and in the middle of the flat areas of the samples.
b
Calculated as a peak-to-peak distance between two adjacent waves.
V. Arima et al. / Thin Solid Films 520 (2012) 2293–2300 2299
Table 5
Experimental results for the QCM tests at different speed of MQ flow.
Flow rate Weight gain (%) Swelling ratio (%) Weight loss (%) Estimated Teflon loss
f2 −f1 f3 −f1 f4 −f2
(μl/min) ∗100
f1
∗100
f1
∗100
f2
(nm)
Fig. 6. SEM images of (a) cross section of the microchannels. Zoom on the (b) and (d) planar interfaces, (c) lateral wall of the microchannels.
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