K20P144M100SF2

Freescale Semiconductor Data Sheet: Advance Information
Document Number: K20P144M100SF2 Rev. 5, 5/2011
Supports the following: MK20DX128ZVLQ10, MK20DX128ZVMD10, MK20DX256ZVLQ10, MK20DX256ZVMD10, MK20DN512ZVLQ10, MK20DN512ZVMD10
K20 Sub-Family Data Sheet
K20P144M100SF2
Features Operating Characteristics Voltage range: 1.71 to 3.6 V Flash write voltage range: 1.71 to 3.6 V Temperature range (ambient): -40 to 105C Performance Up to 100 MHz ARM Cortex-M4 core with DSP instructions delivering 1.25 Dhrystone MIPS per MHz Memories and memory interfaces Up to 512 KB program flash memory on nonFlexMemory devices Up to 128 KB RAM Serial programming interface (EzPort) FlexBus external bus interface Clocks 3 to 32 MHz crystal oscillator 32 kHz crystal oscillator Multi-purpose clock generator System peripherals 10 low-power modes to provide power optimization based on application requirements Memory protection unit with multi-master protection 16-channel DMA controller, supporting up to 64 request sources External watchdog monitor Software watchdog Low-leakage wakeup unit
Security and integrity modules Hardware CRC module to support fast cyclic redundancy checks 128-bit unique identification (ID) number per chip Human-machine interface Low-power hardware touch sensor interface (TSI) General-purpose input/output Analog modules Two 16-bit SAR ADCs Programmable gain amplifier (PGA) (up to x64) integrated into each ADC Two 12-bit DACs Three analog comparators (CMP) containing a 6-bit DAC and programmable reference input Voltage reference Timers Programmable delay block Eight-channel motor control/general purpose/PWM timer Two 2-channel quadrature decoder/general purpose timers Periodic interrupt timers 16-bit low-power timer Carrier modulator transmitter Real-time clock
This document contains information on a new product. Specifications and information herein are subject to change without notice. 20102011 Freescale Semiconductor, Inc. Preliminary
Communication interfaces USB full-/low-speed On-the-Go controller with on-chip transceiver Two Controller Area Network (CAN) modules Three SPI modules Two I2C modules Six UART modules Secure Digital host controller (SDHC) I2S module
K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

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Preliminary
Freescale Semiconductor, Inc.
Table of Contents
1 Ordering parts...........................................................................5 1.1 Determining valid orderable parts......................................5 2 Part identification......................................................................5 2.1 Description.........................................................................5 2.2 Format...............................................................................5 2.3 Fields.................................................................................5 2.4 Example............................................................................6 3 Terminology and guidelines......................................................6 3.1 Definition: Operating requirement......................................6 3.2 Definition: Operating behavior...........................................7 3.3 Definition: Attribute............................................................7 3.4 Definition: Rating...............................................................8 3.5 Result of exceeding a rating..............................................8 3.6 Relationship between ratings and operating requirements......................................................................8 3.7 Guidelines for ratings and operating requirements............9 3.8 Definition: Typical value.....................................................9 3.9 Typical value conditions....................................................10 4 Ratings......................................................................................10 4.1 Thermal handling ratings...................................................11 4.2 Moisture handling ratings..................................................11 4.3 ESD handling ratings.........................................................11 4.4 Voltage and current operating ratings...............................11 5 General.....................................................................................12 5.1 Nonswitching electrical specifications...............................12 5.1.1 5.1.2 5.1.3 5.1.4 5.1.5 5.1.6 5.1.7 5.1.8 Voltage and current operating requirements......12 LVD and POR operating requirements...............13 Voltage and current operating behaviors............14 Power mode transition operating behaviors.......15 Power consumption operating behaviors............16 EMC radiated emissions operating behaviors....20 Designing with radiated emissions in mind.........21 Capacitance attributes........................................21 6.8.7 6.8.8 6.8.9 6.8.10 6.8.6 6 Peripheral operating requirements and behaviors....................24 6.1 Core modules....................................................................24 6.1.1 6.1.2 Debug trace timing specifications.......................24 JTAG electricals..................................................25
6.2 System modules................................................................28 6.3 Clock modules...................................................................28 6.3.1 6.3.2 6.3.3 MCG specifications.............................................28 Oscillator electrical specifications.......................31 32kHz Oscillator Electrical Characteristics.........33
6.4 Memories and memory interfaces.....................................34 6.4.1 6.4.2 6.4.3 Flash (FTFL) electrical specifications.................34 EzPort Switching Specifications.........................36 Flexbus Switching Specifications........................37
6.5 Security and integrity modules..........................................39 6.6 Analog...............................................................................39 6.6.1 6.6.2 6.6.3 6.6.4 ADC electrical specifications..............................39 CMP and 6-bit DAC electrical specifications......47 12-bit DAC electrical characteristics...................49 Voltage reference electrical specifications..........52
6.7 Timers................................................................................53 6.8 Communication interfaces.................................................54 6.8.1 6.8.2 6.8.3 6.8.4 6.8.5 USB electrical specifications...............................54 USB DCD electrical specifications......................54 USB VREG electrical specifications...................54 CAN switching specifications..............................55 DSPI switching specifications (low-speed mode)..................................................................55 DSPI switching specifications (high-speed mode)..................................................................57 I2C switching specifications................................58 UART switching specifications............................59 SDHC specifications...........................................59 I2S switching specifications................................60
5.2 Switching specifications.....................................................21 5.2.1 5.2.2 Device clock specifications.................................21 General switching specifications.........................22
6.9 Human-machine interfaces (HMI)......................................62 6.9.1 TSI electrical specifications................................62
7 Dimensions...............................................................................63 7.1 Obtaining package dimensions.........................................63 8 Pinout........................................................................................63 8.1 K20 Signal Multiplexing and Pin Assignments..................63
5.3 Thermal specifications.......................................................23 5.3.1 5.3.2 Thermal operating requirements.........................23 Thermal attributes...............................................23

Preliminary
8.2 K20 Pinouts.......................................................................70
9 Revision History........................................................................72

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Preliminary
Ordering parts
1 Ordering parts
1.1 Determining valid orderable parts
Valid orderable part numbers are provided on the web. To determine the orderable part numbers for this device, go to http://www.freescale.com and perform a part number search for the following device numbers: PK20 and MK20.
2 Part identification
2.1 Description
Part numbers for the chip have fields that identify the specific part. You can use the values of these fields to determine the specific part you have received.
2.2 Format
Part numbers for this device have the following format: Q K## A M FFF R T PP CC N
2.3 Fields
This table lists the possible values for each field in the part number (not all combinations are valid):
Field Q K## A M Qualification status Kinetis family Key attribute Flash memory type Description Values M = Fully qualified, general market flow P = Prequalification K20 D = Cortex-M4 w/ DSP F = Cortex-M4 w/ DSP and FPU N = Program flash only X = Program flash and FlexMemory Table continues on the next page...

Preliminary
Terminology and guidelines Field FFF Description Program flash memory size 32 = 32 KB 64 = 64 KB 128 = 128 KB 256 = 256 KB 512 = 512 KB 1M0 = 1 MB Values
Silicon revision
Z = Initial (Blank) = Main A = Revision after main V = 40 to 105 C = 40 to 85 FM = 32 QFN (5 mm x 5 mm) FT = 48 QFN (7 mm x 7 mm) LF = 48 LQFP (7 mm x 7 mm) EX = 64 QFN (9 mm x 9 mm) LH = 64 LQFP (10 mm x 10 mm) LK = 80 LQFP (12 mm x 12 mm) MB = 81 MAPBGA (8 mm x 8 mm) LL = 100 LQFP (14 mm x 14 mm) MC = 121 MAPBGA (8 mm x 8 mm) LQ = 144 LQFP (20 mm x 20 mm) MD = 144 MAPBGA (13 mm x 13 mm) MF = 196 MAPBGA (15 mm x 15 mm) MJ = 256 MAPBGA (17 mm x 17 mm) 5 = 50 MHz 7 = 72 MHz 10 = 100 MHz 12 = 120 MHz 15 = 150 MHz
T PP
Temperature range (C) Package identifier
CC
Maximum CPU frequency (MHz)
Packaging type
R = Tape and reel (Blank) = Trays
2.4 Example
This is an example part number: MK20DN512ZVMD10
3 Terminology and guidelines

6
Preliminary
Terminology and guidelines
3.1 Definition: Operating requirement

An operating requirement is a specified value or range of values for a technical characteristic that you must guarantee during operation to avoid incorrect operation and possibly decreasing the useful life of the chip.
3.1.1 Example
This is an example of an operating requirement, which you must meet for the accompanying operating behaviors to be guaranteed:
Symbol VDD Description 1.0 V core supply voltage 0.9 Min. 1.1 Max. V Unit
3.2 Definition: Operating behavior

An operating behavior is a specified value or range of values for a technical characteristic that are guaranteed during operation if you meet the operating requirements and any other specified conditions.
3.2.1 Example
This is an example of an operating behavior, which is guaranteed if you meet the accompanying operating requirements:
Symbol IWP Description Digital I/O weak pullup/ 10 pulldown current Min. 130 Max. A Unit
3.3 Definition: Attribute

An attribute is a specified value or range of values for a technical characteristic that are guaranteed, regardless of whether you meet the operating requirements.

Preliminary
3.3.1 Example
This is an example of an attribute:
Symbol CIN_D Description Input capacitance: digital pins Min. 7 Max. pF Unit
3.4 Definition: Rating

A rating is a minimum or maximum value of a technical characteristic that, if exceeded, may cause permanent chip failure: Operating ratings apply during operation of the chip. Handling ratings apply when the chip is not powered.
3.4.1 Example
This is an example of an operating rating:
Symbol VDD Description 1.0 V core supply voltage 0.3 Min. 1.2 Max. V Unit
3.5 Result of exceeding a rating

40 Failures in time (ppm) 30
20
The likelihood of permanent chip failure increases rapidly as soon as a characteristic begins to exceed one of its operating ratings.
10
0 Operating rating Measured characteristic

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Preliminary
3.6 Relationship between ratings and operating requirements

lin nd ha or g g ing rat (m ) in. e em uir req g tin era ( nt n.) mi e em uir req g ( nt x.) ma lin nd ha or g tin era n ati gr g( ma x.)
tin era Op
Op
t era Op
in
Op
Fatal range
- Probable permanent failure
Limited operating range

- No permanent failure - Possible decreased life - Possible incorrect operation
Normal operating range

- No permanent failure - Correct operation
Limited operating range

- No permanent failure - Possible decreased life - Possible incorrect operation
Fatal range
- Probable permanent failure
Handling range
- No permanent failure
3.7 Guidelines for ratings and operating requirements

Follow these guidelines for ratings and operating requirements: Never exceed any of the chips ratings. During normal operation, dont exceed any of the chips operating requirements. If you must exceed an operating requirement at times other than during normal operation (for example, during power sequencing), limit the duration as much as possible.
3.8 Definition: Typical value

A typical value is a specified value for a technical characteristic that: Lies within the range of values specified by the operating behavior Given the typical manufacturing process, is representative of that characteristic during operation when you meet the typical-value conditions or other specified conditions Typical values are provided as design guidelines and are neither tested nor guaranteed.
3.8.1 Example 1
This is an example of an operating behavior that includes a typical value:

Preliminary
Ratings Symbol IWP Description Digital I/O weak pullup/pulldown current 10 Min. 70 Typ. 130 Max. A Unit
3.8.2 Example 2
This is an example of a chart that shows typical values for various voltage and temperature conditions:
5000 4500 4000 3500 IDD_STOP (A) 3000 2500 2000 1500 1000 500 0 0.90 0.95 1.00 VDD (V) 1.05 1.10 TJ 150 C 105 C 25 C 40 C
3.9 Typical value conditions

Typical values assume you meet the following conditions (or other conditions as specified):
Symbol TA VDD Description Ambient temperature 3.3 V supply voltage 25 3.3 Value C V Unit
4 Ratings
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Preliminary
Ratings
4.1 Thermal handling ratings

Symbol TSTG TSDR Description Storage temperature Solder temperature, lead-free Solder temperature, leaded Min. 55 Max. 150 260 245 Unit C C Notes 1 2
1. Determined according to JEDEC Standard JESD22-A103, High Temperature Storage Life. 2. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices.
4.2 Moisture handling ratings

Symbol MSL Description Moisture sensitivity level Min. Max. 3 Unit Notes 1
1. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic Solid State Surface Mount Devices.
4.3 ESD handling ratings

Symbol VHBM VCDM ILAT Description Electrostatic discharge voltage, human body model Electrostatic discharge voltage, charged-device model Latch-up current at ambient temperature of 105C Min. -2000 -500 -100 Max. +2000 +500 +100 Unit V V mA Notes 1 2
1. Determined according to JEDEC Standard JESD22-A114, Electrostatic Discharge (ESD) Sensitivity Testing Human Body Model (HBM). 2. Determined according to JEDEC Standard JESD22-C101, Field-Induced Charged-Device Model Test Method for Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components.
4.4 Voltage and current operating ratings

Symbol VDD IDD VDIO Description Digital supply voltage Digital supply current Digital input voltage (except RESET, EXTAL, and XTAL) Table continues on the next page... Min. 0.3 0.3 Max. 3.8 185 5.5 Unit V mA V

Preliminary
11
General Symbol VAIO ID VDDA VUSB_DP VUSB_DM VREGIN VBAT Description Analog1, RESET, EXTAL, and XTAL input voltage Min. 0.3 25 VDD 0.3 0.3 0.3 0.3 0.3 Max. VDD + 0.3 25 VDD + 0.3 3.63 3.63 6.0 3.8 Unit V mA V V V V V
Instantaneous maximum current single pin limit (applies to all port pins) Analog supply voltage USB_DP input voltage USB_DM input voltage USB regulator input RTC battery supply voltage
1. Analog pins are defined as pins that do not have an associated general purpose I/O port function.
5 General
5.1 Nonswitching electrical specifications
5.1.1 Voltage and current operating requirements
Table 1. Voltage and current operating requirements
Symbol VDD VDDA Description Supply voltage Analog supply voltage Min. 1.71 1.71 0.1 0.1 1.71 Max. 3.6 3.6 0.1 0.1 3.6 Unit V V V V V Notes
VDD VDDA VDD-to-VDDA differential voltage VSS VSSA VSS-to-VSSA differential voltage VBAT VIH RTC battery supply voltage Input high voltage 2.7 V VDD 3.6 V 1.7 V VDD 2.7 V VIL Input low voltage 2.7 V VDD 3.6 V 1.7 V VDD 2.7 V VHYS IICDIO Input hysteresis Digital pin negative DC injection current single pin VIN < VSS-0.3V
0.7 VDD 0.75 VDD
V V
0.06 VDD -5 Table continues on the next page...
0.35 VDD 0.3 VDD
V V V 1 mA

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Preliminary
General
Table 1. Voltage and current operating requirements (continued)

Symbol IICAIO Description Analog2, EXTAL, and XTAL pin DC injection current single pin VIN < VSS-0.3V (Negative current injection) VIN > VDD+0.3V (Positive current injection) IICcont Contiguous pin DC injection current regional limit, includes sum of negative injection currents or sum of positive injection currents of 16 contiguous pins Negative current injection Positive current injection VRAM VRFVBAT VDD voltage required to retain RAM VBAT voltage required to retain the VBAT register file -5 +5 Min. Max. Unit Notes 3 mA
-25 1.2 TBD
+25
mA
V V
1. All 5 volt tolerant digital I/O pins are internally clamped to VSS through a ESD protection diode. There is no diode connection to VDD. If VIN greater than VDIO_MIN (=VSS-0.3V) is observed, then there is no need to provide current limiting resistors at the pads. If this limit cannot be observed then a current limiting resistor is required. The negative DC injection current limiting resistor is calculated as R=(VDIO_MIN-VIN)/|IIC|. 2. Analog pins are defined as pins that do not have an associated general purpose I/O port function. 3. All analog pins are internally clamped to VSS and VDD through ESD protection diodes. If VIN is greater than VAIO_MIN (=VSS-0.3V) and VIN is less than VAIO_MAX(=VDD+0.3V) is observed, then there is no need to provide current limiting resistors at the pads. If these limits cannot be observed then a current limiting resistor is required. The negative DC injection current limiting resistor is calculated as R=(VAIO_MIN-VIN)/|IIC|. The positive injection current limiting resistor is calcualted as R=(VIN-VAIO_MAX)/|IIC|. Select the larger of these two calculated resistances.
5.1.2 LVD and POR operating requirements

Table 2. VDD supply LVD and POR operating requirements
Symbol VPOR VLVDH Description Falling VDD POR detect voltage Falling low-voltage detect threshold high range (LVDV=01) Low-voltage warning thresholds high range VLVW1H VLVW2H VLVW3H VLVW4H VHYSH VLVDL Level 1 falling (LVWV=00) Level 2 falling (LVWV=01) Level 3 falling (LVWV=10) Level 4 falling (LVWV=11) Low-voltage inhibit reset/recover hysteresis high range Falling low-voltage detect threshold low range (LVDV=00) TBD TBD TBD TBD TBD 2.70 2.80 2.90 3.00 60 1.60 TBD TBD TBD TBD TBD V V V V mV V Min. TBD TBD Typ. 1.1 2.56 Max. TBD TBD Unit V V 1 Notes
Table continues on the next page...

Preliminary
13
General
Table 2. VDD supply LVD and POR operating requirements (continued)

Symbol Description Low-voltage warning thresholds low range VLVW1L VLVW2L VLVW3L VLVW4L VHYSL VBG tLPO Level 1 falling (LVWV=00) Level 2 falling (LVWV=01) Level 3 falling (LVWV=10) Level 4 falling (LVWV=11) Low-voltage inhibit reset/recover hysteresis low range Bandgap voltage reference Internal low power oscillator period factory trimmed TBD TBD TBD TBD TBD TBD 1.80 1.90 2.00 2.10 40 1.00 1000 TBD TBD TBD TBD TBD TBD V V V V mV V s Min. Typ. Max. Unit Notes 1
1. Rising thresholds are falling threshold + hysteresis voltage
Table 3. VBAT power operating requirements

Symbol Description Min. TBD Typ. 1.1 Max. TBD Unit V Notes VPOR_VBAT Falling VBAT supply POR detect voltage
5.1.3 Voltage and current operating behaviors

Table 4. Voltage and current operating behaviors
Symbol VOH Description Output high voltage high drive strength 2.7 V VDD 3.6 V, IOH = -10mA 1.71 V VDD 2.7 V, IOH = -3mA Output high voltage low drive strength 2.7 V VDD 3.6 V, IOH = -2mA 1.71 V VDD 2.7 V, IOH = -0.6mA IOHT VOL Output high current total for all ports Output low voltage high drive strength 2.7 V VDD 3.6 V, IOL = 10mA 1.71 V VDD 2.7 V, IOL = 3mA Output low voltage low drive strength 2.7 V VDD 3.6 V, IOL = 2mA 1.71 V VDD 2.7 V, IOL = 0.6mA 0.5 0.5 V V 0.5 0.5 V V VDD 0.5 VDD 0.5 100 V V mA VDD 0.5 VDD 0.5 V V Min. Max. Unit Notes

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Preliminary
General
Table 4. Voltage and current operating behaviors (continued)

Symbol IOLT IIN IIN IOZ RPU RPD Description Output low current total for all ports Input leakage current (per pin) for full temperature range Input leakage current (per pin) at 25C Hi-Z (off-state) leakage current (per pin) Internal pullup resistors Internal pulldown resistors Min. 20 20 Max. 100 1 TBD 1 50 50 Unit mA A A A k k 2 3 1 1 Notes
1. Measured at VDD=3.6V 2. Measured at VDD supply voltage = VDD min and Vinput = VSS 3. Measured at VDD supply voltage = VDD min and Vinput = VDD
5.1.4 Power mode transition operating behaviors

All specifications except tPOR, and VLLSxRUN recovery times in the following table assume this clock configuration: CPU and system clocks = 100 MHz Bus clock = 50 MHz FlexBus clock = 50 MHz Flash clock = 25 MHz
Table 5. Power mode transition operating behaviors
Symbol tPOR Description After a POR event, amount of time from the point VDD reaches 1.71 V to execution of the first instruction across the operating temperature range of the chip. RUN VLLS1 RUN RUN VLLS1 VLLS1 RUN RUN VLLS2 RUN RUN VLLS2 VLLS2 RUN RUN VLLS3 RUN RUN VLLS3 VLLS3 RUN Table continues on the next page... 4.1 49.2 s s 4.1 49.3 s s 4.1 123.8 s s Min. Max. 300 Unit s Notes 1

Preliminary
15
General
Table 5. Power mode transition operating behaviors (continued)

Symbol Description RUN LLS RUN RUN LLS LLS RUN RUN STOP RUN RUN STOP STOP RUN RUN VLPS RUN RUN VLPS VLPS RUN 1. Normal boot (FTFL_OPT[LPBOOT]=1) 4.1 5.8 s s 4.1 4.2 s s 4.1 5.9 s s Min. Max. Unit Notes
5.1.5 Power consumption operating behaviors

Table 6. Power consumption operating behaviors
Symbol IDDA IDD_RUN Description Analog supply current Run mode current all peripheral clocks disabled, code executing from flash @ 1.8V @ 3.0V IDD_RUN Run mode current all peripheral clocks enabled, code executing from flash @ 1.8V @ 3.0V IDD_RUN_M Run mode current all peripheral clocks enabled and peripherals active, code executing AX from flash @ 1.8V @ 3.0V @ 25C @ 125C IDD_WAIT IDD_WAIT Wait mode high frequency current at 3.0 V all peripheral clocks disabled Wait mode reduced frequency current at 3.0 V all peripheral clocks disabled 35 15 TBD TBD mA mA 2 5 4 66 66 TBD TBD TBD TBD mA mA mA 3 55 56 TBD TBD mA mA Min. Typ. 40 42 Max. TBD TBD TBD Unit mA mA mA Notes 1 2

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Preliminary
General
Table 6. Power consumption operating behaviors (continued)

Symbol IDD_STOP Description Stop mode current at 3.0 V @ 40 to 25C @ 70C @ 105C IDD_VLPR IDD_VLPR IDD_VLPW IDD_VLPS Very-low-power run mode current at 3.0 V all peripheral clocks disabled Very-low-power run mode current at 3.0 V all peripheral clocks enabled Very-low-power wait mode current at 3.0 V Very-low-power stop mode current at 3.0 V @ 40 to 25C @ 70C @ 105C IDD_LLS Low leakage stop mode current at 3.0 V @ 40 to 25C @ 70C @ 105C IDD_VLLS3 Very low-leakage stop mode 3 current at 3.0 V @ 40 to 25C @ 70C @ 105C IDD_VLLS2 Very low-leakage stop mode 2 current at 3.0 V @ 40 to 25C @ 70C @ 105C IDD_VLLS1 Very low-leakage stop mode 1 current at 3.0 V @ 40 to 25C @ 70C @ 105C IDD_VBAT Average current when CPU is not accessing RTC registers at 3.0 V @ 40 to 25C @ 70C @ 105C 1. The analog supply current is the sum of the active or disabled current for each of the analog modules on the device. See each module's specification for its supply current. 10 0.7 TBD TBD TBD TBD TBD A A A 2 TBD TBD TBD TBD TBD A A A 4 TBD TBD TBD TBD TBD A A A 8 TBD TBD TBD TBD TBD A A A 9 12 TBD TBD TBD TBD TBD A A A 9 1.25 TBD 1.05 50 TBD TBD TBD TBD TBD TBD TBD TBD mA mA mA A A A 6 7 8 Min. Typ. 0.4 TBD TBD Max. TBD TBD TBD Unit mA mA mA Notes

Preliminary
17
General 2. 100MHz core and system clock, 50MHz bus and FlexBus clock, and 25MHz flash clock . MCG configured for FEI mode. All peripheral clocks disabled. 3. 100MHz core and system clock, 50MHz bus and FlexBus clock, and 25MHz flash clock. MCG configured for FEI mode. All peripheral clocks enabled, but peripherals are not in active operation. 4. 100MHz core and system clock, 50MHz bus and FlexBus clock, and 25MHz flash clock. MCG configured for FEI mode. All peripheral clocks enabled, and peripherals are in active operation. 5. 25MHz core and system clock, 25MHz bus clock, and 12.5MHz FlexBus and flash clock. MCG configured for FEI mode. 6. 2 MHz core, system, FlexBus, and bus clock and 1MHz flash clock. MCG configured for BLPE mode. All peripheral clocks disabled. Code executing from flash. 7. 2 MHz core, system, FlexBus, and bus clock and 1MHz flash clock. MCG configured for BLPE mode. All peripheral clocks enabled but peripherals are not in active operation. Code executing from flash. 8. 2 MHz core, system, FlexBus, and bus clock and 1MHz flash clock. MCG configured for BLPE mode. All peripheral clocks disabled. 9. Data reflects devices with 128 KB of RAM. For devices with 64 KB of RAM, power consumption is reduced by 2 A. For devices with 32 KB of RAM, power consumption is reduced by 3 A. 10. Includes 32kHz oscillator current and RTC operation.
5.1.5.1
Diagram: Typical IDD_RUN operating behavior
The following data was measured under these conditions: MCG in FEI mode (39.0625 kHz IRC), except for 1 MHz core (FBE) All peripheral clocks disabled except FTFL LVD disabled, USB regulator disabled No GPIOs toggled Code execution from flash

18
Preliminary
General
Figure 1. Run mode supply current vs. core frequency all peripheral clocks disabled
The following data was measured under these conditions: MCG in FEI mode (39.0625 kHz IRC), except for 1 MHz core (FBE) All peripheral clocks enabled but peripherals are not in active operation LVD disabled, USB regulator disabled No GPIOs toggled Code execution from flash

Preliminary
19
General
Figure 2. Run mode supply current vs. core frequency all peripheral clocks enabled
5.1.6 EMC radiated emissions operating behaviors

Table 7. EMC radiated emissions operating behaviors
Symbol VRE1 VRE2 VRE3 VRE4 Description Radiated emissions voltage, band 1 Radiated emissions voltage, band 2 Radiated emissions voltage, band 3 Radiated emissions voltage, band 4 Frequency band (MHz) 0.1550 50150 150500 5001000 0.151000 Typ. TBD TBD TBD TBD TBD Unit dBV dBV dBV dBV 2, 3 Notes 1, 2
VRE_IEC_SAE IEC and SAE level
1. Determined according to IEC Standard 61967-1, Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 1: General Conditions and Definitions, IEC Standard 61967-2, Integrated Circuits - Measurement of Electromagnetic Emissions, 150 kHz to 1 GHz Part 2: Measurement of Radiated EmissionsTEM Cell and Wideband TEM Cell Method, and SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated CircuitsTEM/ Wideband TEM (GTEM) Cell Method. 2. VDD = 3 V, TA = 25 C, fOSC = 12 MHz (crystal), fSYS = 96 MHz

20
Preliminary
General 3. Specified according to Annex D of IEC Standard 61967-2, Measurement of Radiated EmissionsTEM Cell and Wideband TEM Cell Method, and Appendix D of SAE Standard J1752-3, Measurement of Radiated Emissions from Integrated CircuitsTEM/Wideband TEM (GTEM) Cell Method.
5.1.7 Designing with radiated emissions in mind

To find application notes that provide guidance on designing your system to minimize interference from radiated emissions: 1. Go to http://www.freescale.com. 2. Perform a keyword search for EMC design.
5.1.8 Capacitance attributes

Table 8. Capacitance attributes
Symbol CIN_A CIN_D Description Input capacitance: analog pins Input capacitance: digital pins Min. Max. 7 7 Unit pF pF
5.2 Switching specifications

5.2.1 Device clock specifications
Table 9. Device clock specifications
Symbol Description Normal run mode fSYS fSYS_USB fBUS FB_CLK fFLASH fLPTMR System and core clock System and core clock when Full Speed USB in operation Bus clock FlexBus clock Flash clock LPTMR clock VLPR mode fSYS fBUS FB_CLK System and core clock Bus clock FlexBus clock Table continues on the next page... 2 2 2 MHz MHz MHz 20 100 50 50 25 25 MHz MHz MHz MHz MHz MHz Min. Max. Unit Notes

Preliminary
21
General
Table 9. Device clock specifications (continued)

Symbol fFLASH fLPTMR Description Flash clock LPTMR clock Min. Max. 1 25 Unit MHz MHz Notes
5.2.2 General switching specifications

These general purpose specifications apply to all signals configured for GPIO, UART, CAN, CMT, and I2C signals.
Table 10. General switching specifications
Symbol Description GPIO pin interrupt pulse width (digital glitch filter disabled) Synchronous path GPIO pin interrupt pulse width (digital glitch filter disabled, analog filter enabled) Asynchronous path GPIO pin interrupt pulse width (digital glitch filter disabled, analog filter disabled) Asynchronous path External reset pulse width (digital glitch filter disabled) Mode select (EZP_CS) hold time after reset deassertion Port rise and fall time (high drive strength) Slew disabled 1.71 VDD 2.7V 2.7 VDD 3.6V Slew enabled 1.71 VDD 2.7V 2.7 VDD 3.6V Port rise and fall time (low drive strength) Slew disabled 1.71 VDD 2.7V 2.7 VDD 3.6V Slew enabled 1.71 VDD 2.7V 2.7 VDD 3.6V 32 TBD 36 TBD ns ns ns ns 4 12 TBD 36 TBD ns ns ns ns Min. 1.5 100 16 100 2 Max. Unit Bus clock cycles ns ns ns Bus clock cycles 3 Notes 1 2 2 2
1. The greater synchronous and asynchronous timing must be met.

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Preliminary
General 2. This is the shortest pulse that is guaranteed to be recognized. 3. 75pF load 4. 15pF load
5.3 Thermal specifications

5.3.1 Thermal operating requirements
Table 11. Thermal operating requirements
Symbol TJ TA Description Die junction temperature Ambient temperature Min. 40 40 Max. 125 105 Unit C C
5.3.2 Thermal attributes

Board type
Single-layer (1s)
Symbol
RJA
Description
144 LQFP
50
144 MAPBGA
Unit
C/W
Notes
1
Thermal 52 resistance, junction to ambient (natural convection) Thermal 44 resistance, junction to ambient (natural convection) Thermal 43 resistance, junction to ambient (200 ft./ min. air speed) Thermal 38 resistance, junction to ambient (200 ft./ min. air speed) Thermal resistance, junction to board Thermal resistance, junction to case 33
Four-layer (2s2p)
RJA
30
C/W
Single-layer (1s)
RJMA
41
C/W
Four-layer (2s2p)
RJMA
27
C/W
RJB
17
C/W
RJC
11
10
C/W

Preliminary
23
Peripheral operating requirements and behaviors
Board type
Symbol
JT
Description
144 LQFP
2
144 MAPBGA
Unit
C/W
Notes
4
Thermal 2 characterization parameter, junction to package top outside center (natural convection)
1.
2. 3.
4.
Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental ConditionsNatural Convection (Still Air), or EIA/JEDEC Standard JESD51-6, Integrated Circuit Thermal Test Method Environmental ConditionsForced Convection (Moving Air). Determined according to JEDEC Standard JESD51-8, Integrated Circuit Thermal Test Method Environmental ConditionsJunction-to-Board. Determined according to Method 1012.1 of MIL-STD 883, Test Method Standard, Microcircuits, with the cold plate temperature used for the case temperature. The value includes the thermal resistance of the interface material between the top of the package and the cold plate. Determined according to JEDEC Standard JESD51-2, Integrated Circuits Thermal Test Method Environmental ConditionsNatural Convection (Still Air).
6 Peripheral operating requirements and behaviors

All digital I/O switching characteristics assume: 1. output pins have CL=30pF loads, are configured for fast slew rate (PORTx_PCRn[SRE]=0), and are configured for high drive strength (PORTx_PCRn[DSE]=1) 2. input pins have their passive filter disabled (PORTx_PCRn[PFE]=0)
6.1 Core modules

6.1.1 Debug trace timing specifications
Table 12. Debug trace operating behaviors
Symbol Tcyc Twl Twh Description Clock period Low pulse width High pulse width Table continues on the next page... Min. Max. Unit MHz ns ns Frequency dependent 2 2

24
Preliminary
Table 12. Debug trace operating behaviors (continued)

Symbol Tr Tf Ts Th Description Clock and data rise time Clock and data fall time Data setup Data hold Min. 3 2 Max. 3 3 Unit ns ns ns ns
Figure 3. TRACE_CLKOUT specifications
TRACE_CLKOUT
Ts Th Ts Th
TRACE_D[3:0]
Figure 4. Trace data specifications
6.1.2 JTAG electricals

Table 13. JTAG limited voltage range electricals
Symbol Description Operating voltage J1 TCLK frequency of operation Boundary Scan JTAG and CJTAG Serial Wire Debug J2 J3 TCLK cycle period TCLK clock pulse width Boundary Scan JTAG and CJTAG Serial Wire Debug Table continues on the next page... 50 20 10 ns ns ns 0 0 0 1/J1 10 25 50 ns Min. 2.7 Max. 3.6 Unit V MHz

Preliminary
25
Table 13. JTAG limited voltage range electricals (continued)

Symbol J4 J5 J6 J7 J8 J9 J10 J11 J12 J13 J14 Description TCLK rise and fall times Boundary scan input data setup time to TCLK rise Boundary scan input data hold time after TCLK rise TCLK low to boundary scan output data valid TCLK low to boundary scan output high-Z TMS, TDI input data setup time to TCLK rise TMS, TDI input data hold time after TCLK rise TCLK low to TDO data valid TCLK low to TDO high-Z TRST assert time TRST setup time (negation) to TCLK high Min. 20 0 8 1 100 8 Max. 3 25 25 17 17 Unit ns ns ns ns ns ns ns ns ns ns ns
Table 14. JTAG full voltage range electricals

Symbol Description Operating voltage J1 TCLK frequency of operation Boundary Scan JTAG and CJTAG Serial Wire Debug J2 J3 TCLK cycle period TCLK clock pulse width Boundary Scan JTAG and CJTAG Serial Wire Debug J4 J5 J6 J7 J8 J9 J10 J11 J12 J13 J14 TCLK rise and fall times Boundary scan input data setup time to TCLK rise Boundary scan input data hold time after TCLK rise TCLK low to boundary scan output data valid TCLK low to boundary scan output high-Z TMS, TDI input data setup time to TCLK rise TMS, TDI input data hold time after TCLK rise TCLK low to TDO data valid TCLK low to TDO high-Z TRST assert time TRST setup time (negation) to TCLK high 50 25 12.5 20 0 8 1.4 100 8 3 25 25 22.1 22.1 ns ns ns ns ns ns ns ns ns ns ns ns ns ns 0 0 0 1/J1 10 20 40 ns Min. 1.71 Max. 3.6 Unit V MHz

26
Preliminary

J2 J3 J3
TCLK (input)
J4
J4
Figure 5. Test clock input timing
TCLK
J5 J6
Data inputs
J7
Input data valid
Data outputs
J8
Output data valid
Data outputs
J7
Data outputs
Output data valid
Figure 6. Boundary scan (JTAG) timing

Preliminary
27
TCLK
J9 J10
TDI/TMS
J11
Input data valid
TDO
J12
Output data valid
TDO
J11
TDO
Output data valid
Figure 7. Test Access Port timing
TCLK
J14 J13
TRST
Figure 8. TRST timing
6.2 System modules

There are no specifications necessary for the device's system modules.
6.3 Clock modules

28
Preliminary
6.3.1 MCG specifications

Table 15. MCG specifications
Symbol fints_ft fints_t Iints tirefsts fdco_res_t Description Internal reference frequency (slow clock) factory trimmed at nominal VDD and 25C Internal reference frequency (slow clock) user trimmed Internal reference (slow clock) current Internal reference (slow clock) startup time Resolution of trimmed DCO output frequency at fixed voltage and temperature using SCTRIM and SCFTRIM Resolution of trimmed DCO output frequency at fixed voltage and temperature using SCTRIM only Total deviation of trimmed average DCO output frequency over voltage and temperature Total deviation of trimmed average DCO output frequency over fixed voltage and temperature range of 070C Internal reference frequency (fast clock) factory trimmed at nominal VDD and 25C Internal reference frequency (fast clock) user trimmed Internal reference (fast clock) current Internal reference startup time (fast clock) Loss of external clock minimum frequency RANGE = 00 Loss of external clock minimum frequency RANGE = 01, 10, or 11 FLL ffll_ref fdco FLL reference frequency range DCO output frequency range Low range (DRS=00) 640 ffll_ref Mid range (DRS=01) 1280 ffll_ref Mid-high range (DRS=10) 1920 ffll_ref High range (DRS=11) 2560 ffll_ref Table continues on the next page... 80 83.89 100 MHz 60 62.91 75 MHz 40 41.94 50 MHz 31.25 20 20.97 39.0625 25 kHz MHz 3, 4 Min. 31.25 Typ. 32.768 TBD TBD 0.1 Max. 39.0625 4 0.3 Unit kHz kHz A s %fdco 1 2 Notes
fdco_res_t
0.2
0.5
%fdco
fdco_t fdco_t
+ 0.5 - 1.0
3.5
%fdco %fdco
0.5
TBD
fintf_ft fintf_t Iintf tirefstf floc_low floc_high
3.4 3 (3/5) x fints_t (16/5) x fints_t
TBD TBD
4 5 TBD
MHz MHz A s kHz kHz 1

Preliminary
29
Table 15. MCG specifications (continued)

Symbol Description Low range (DRS=00) 732 ffll_ref Mid range (DRS=01) 1464 ffll_ref Mid-high range (DRS=10) 2197 ffll_ref High range (DRS=11) 2929 ffll_ref Jcyc_fll Jacc_fll tfll_acquire FLL period jitter FLL accumulated jitter of DCO output over a 1s time window FLL target frequency acquisition time PLL fvco Ipll VCO operating frequency PLL operating current PLL @ 96 MHz (fosc_hi_1 = 8 MHz, fpll_ref = 2 MHz, VDIV multiplier = 48) PLL operating current PLL @ 48 MHz (fosc_hi_1 = 8 MHz, fpll_ref = 2 MHz, VDIV multiplier = 24) PLL reference frequency range PLL period jitter (RMS) fvco = 48 MHz fvco = 100 MHz Jacc_pll PLL accumulated jitter over 1s (RMS) fvco = 48 MHz fvco = 100 MHz Dlock Dunl tpll_lock Lock entry frequency tolerance Lock exit frequency tolerance Lock detector detection time 1.49 4.47 1350 600 2.98 5.97 0.15 + 1075(1/ fpll_ref) ps ps % % ms 11 120 50 ps ps 10 48.0 1060 100 MHz A 9 TBD TBD TBD TBD 1 ps ps ms 7 7 8 95.98 MHz 71.99 MHz 47.97 MHz Min. Typ. 23.99 Max. Unit MHz Notes 5, 6 fdco_t_DMX3 DCO output frequency 2
Ipll
600
fpll_ref Jcyc_pll
2.0
4.0
MHz 10
1. The startup time is defined as the time between the IRC being enabled, either by the MCG or by the IRCLKEN bit being set, and the first edge of the internal reference clock. 2. This parameter is measured with the internal reference (slow clock) being used as a reference to the FLL (FEI clock mode). 3. These typical values listed are with the slow internal reference clock (FEI) using factory trim and DMX32=0. 4. The resulting system clock frequencies should not exceed their maximum specified values. The DCO frequency deviation (fdco_t) over voltage and temperature should be considered.

30
Preliminary
Peripheral operating requirements and behaviors 5. 6. 7. 8. These typical values listed are with the slow internal reference clock (FEI) using factory trim and DMX32=1. The resulting clock frequency must not exceed the maximum specified clock frequency of the device. This specification was obtained at TBD frequency. This specification applies to any time the FLL reference source or reference divider is changed, trim value is changed, DMX32 bit is changed, DRS bits are changed, or changing from FLL disabled (BLPE, BLPI) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used as the reference, this specification assumes it is already running. 9. Excludes any oscillator currents that are also consuming power while PLL is in operation. 10. This specification was obtained using a Freescale developed PCB. PLL jitter is dependent on the noise characteristics of each PCB and results will vary. 11. This specification applies to any time the PLL VCO divider or reference divider is changed, or changing from PLL disabled (BLPE, BLPI) to PLL enabled (PBE, PEE). If a crystal/resonator is being used as the reference, this specification assumes it is already running.
6.3.2 Oscillator electrical specifications

This section provides the electrical characteristics of the module. 6.3.2.1
Symbol VDD IDDOSC
Oscillator DC electrical specifications

Description Supply voltage Supply current low-power mode (HGO=0) 32 kHz 4 MHz 8 MHz (only RANGE=01) 16 MHz 24 MHz 32 MHz Min. 1.71
Table 16. Oscillator DC electrical specifications

Typ. Max. 3.6 Unit V 1 500 200 300 950 1.2 1.5 nA A A A mA mA 1 Table continues on the next page... 25 400 500 2.5 3 4 A A A mA mA mA 2, 3 2, 3 Notes
IDDOSC
Supply current high gain mode (HGO=1) 32 kHz 4 MHz 8 MHz (only RANGE=01) 16 MHz 24 MHz 32 MHz
Cx Cy
EXTAL load capacitance XTAL load capacitance

Preliminary
31
Table 16. Oscillator DC electrical specifications (continued)

Symbol RF Description Feedback resistor low-frequency, low-power mode (HGO=0) Feedback resistor low-frequency, high-gain mode (HGO=1) Feedback resistor high-frequency, low-power mode (HGO=0) Feedback resistor high-frequency, high-gain mode (HGO=1) RS Series resistor low-frequency, low-power mode (HGO=0) Series resistor low-frequency, high-gain mode (HGO=1) Series resistor high-frequency, low-power mode (HGO=0) Series resistor high-frequency, high-gain mode (HGO=1) Vpp5 Peak-to-peak amplitude of oscillation (oscillator mode) low-frequency, low-power mode (HGO=0) Peak-to-peak amplitude of oscillation (oscillator mode) low-frequency, high-gain mode (HGO=1) Peak-to-peak amplitude of oscillation (oscillator mode) high-frequency, low-power mode (HGO=0) Peak-to-peak amplitude of oscillation (oscillator mode) high-frequency, high-gain mode (HGO=1) 1. 2. 3. 4. 5. 0 0.6 k V Min. Typ. 10 1 200 Max. Unit M M M M k k k Notes 2, 4
VDD
0.6
VDD
VDD=3.3 V, Temperature =25 C See crystal or resonator manufacturer's recommendation Cx,Cy can be provided by using either the integrated capacitors or by using external components. When low power mode is selected, RF is integrated and must not be attached externally. The EXTAL and XTAL pins should only be connected to required oscillator components and must not be connected to any other devices.
6.3.2.2
Symbol fosc_lo
Oscillator frequency specifications

Description Oscillator crystal or resonator frequency low frequency mode (MCG_C2[RANGE]=00) Min. 32
Table 17. Oscillator frequency specifications

Typ. Max. 40 Unit kHz Notes

32
Preliminary
Table 17. Oscillator frequency specifications (continued)

Symbol fosc_hi_1 Description Oscillator crystal or resonator frequency high frequency mode (low range) (MCG_C2[RANGE]=01) Oscillator crystal or resonator frequency high frequency mode (high range) (MCG_C2[RANGE]=1x) Input clock frequency (external clock mode) Input clock duty cycle (external clock mode) Crystal startup time 32 kHz low-frequency, low-power mode (HGO=0) Crystal startup time 32 kHz low-frequency, high-gain mode (HGO=1) Crystal startup time 8 MHz high-frequency (MCG_C2[RANGE]=01), low-power mode (HGO=0) Crystal startup time 8 MHz high-frequency (MCG_C2[RANGE]=01), high-gain mode (HGO=1) Min. 3 Typ. Max. 8 Unit MHz Notes
fosc_hi_2
32
MHz
fec_extal tdc_extal tcst
40
50 750 250 0.6
50 60
MHz % ms ms ms
2, 3
ms
1. Other frequency limits may apply when external clock is being used as a reference for the FLL or PLL 2. Proper PC board layout procedures must be followed to achieve specifications. 3. Crystal startup time is defined as the time between the oscillator being enabled and the OSCINIT bit in the MCG_S register being set.
6.3.3 32kHz Oscillator Electrical Characteristics

This section describes the module electrical characteristics. 6.3.3.1
Symbol VBAT RF Cpara Cload Vpp1
32kHz oscillator DC electrical specifications

Description Supply voltage Internal feedback resistor Parasitical capacitance of EXTAL32 and XTAL32 Internal load capacitance (programmable) Peak-to-peak amplitude of oscillation Min. 1.71
Table 18. 32kHz oscillator DC electrical specifications

Typ. 100 2.5 15 0.6 Max. 3.6 Unit V M pF pF V
1. The EXTAL32 and XTAL32 pins should only be connected to required oscillator components and must not be connected to any other devices.

Preliminary
33
6.3.3.2
Symbol fosc_lo tstart
32kHz oscillator frequency specifications

Description Oscillator crystal Crystal start-up time Min.
Table 19. 32kHz oscillator frequency specifications

Typ. 32.768 1000 Max. Unit kHz ms 1 Notes
1. Proper PC board layout procedures must be followed to achieve specifications.
6.4 Memories and memory interfaces

6.4.1 Flash (FTFL) electrical specifications
This section describes the electrical characteristics of the FTFL module. 6.4.1.1 Flash timing specifications program and erase
The following specifications represent the amount of time the internal charge pumps are active and do not include command overhead.
Table 20. NVM program/erase timing specifications
Symbol thvpgm4 thversscr Description Longword Program high-voltage time Sector Erase high-voltage time Min. Typ. 20 20 160 Max. TBD 100 800 Unit s ms ms 1 1 Notes
thversblk256k Erase Block high-voltage time for 256 KB 1. Maximum time based on expectations at cycling end-of-life.
6.4.1.2
Symbol
Flash timing specifications commands

Description Read 1s Block execution time Min.
Table 21. Flash command timing specifications

Typ. Max. Unit Notes
trd1blk256k trd1sec2k tpgmchk trdrsrc tpgm4
256 KB data flash Read 1s Section execution time (flash sector) Program Check execution time Read Resource execution time Program Longword execution time
50
1.4 40 35 35 TBD
ms s s s s 1 1 1

34
Preliminary
Table 21. Flash command timing specifications (continued)

Symbol Description Erase Flash Block execution time tersblk256k tersscr 256 KB data flash Erase Flash Sector execution time Program Section execution time tpgmsec512 tpgmsec1k tpgmsec2k trd1all trdonce tpgmonce tersall tvfykey 512 B flash 1 KB flash 2 KB flash Read 1s All Blocks execution time Read Once execution time Program Once execution time Erase All Blocks execution time Verify Backdoor Access Key execution time Swap Control execution time tswapx01 tswapx02 tswapx04 tswapx08 control code 0x01 control code 0x02 control code 0x04 control code 0x08 TBD TBD TBD TBD TBD TBD TBD TBD s s s s TBD TBD TBD 50 320 TBD TBD TBD 2.8 35 TBD 1600 35 ms ms ms ms s s ms s 2 1 1 160 20 800 100 ms ms 2 Min. Typ. Max. Unit Notes 2
1. Assumes 25MHz flash clock frequency. 2. Maximum times for erase parameters based on expectations at cycling end-of-life.
6.4.1.3
Flash (FTFL) current and power specfications

Description Worst case programming current in program flash
Table 22. Flash (FTFL) current and power specfications

Typ. 10 Unit mA
Symbol IDD_PGM
6.4.1.4
Symbol
Reliability specifications
Description
Table 23. NVM reliability specifications

Min. Program Flash Typ.1 Max. Unit Notes
tnvmretp10k tnvmretp1k tnvmretp100 nnvmcycp
Data retention after up to 10 K cycles Data retention after up to 1 K cycles Data retention after up to 100 cycles Cycling endurance
5 10 15 10 K
TBD TBD TBD TBD
years years years cycles
2 2 2 3

Preliminary
35
Peripheral operating requirements and behaviors 1. Typical data retention values are based on intrinsic capability of the technology measured at high temperature derated to 25C. For additional information on how Freescale defines typical data retention, please refer to Engineering Bulletin EB618. 2. Data retention is based on Tjavg = 55C (temperature profile over the lifetime of the application). 3. Cycling endurance represents number of program/erase cycles at -40C Tj 125C.
6.4.2 EzPort Switching Specifications

Table 24. EzPort switching specifications
Num Description Operating voltage EP1 EP1a EP2 EP3 EP4 EP5 EP6 EP7 EP8 EP9 EZP_CK frequency of operation (all commands except READ) EZP_CK frequency of operation (READ command) EZP_CS negation to next EZP_CS assertion EZP_CS input valid to EZP_CK high (setup) EZP_CK high to EZP_CS input invalid (hold) EZP_D input valid to EZP_CK high (setup) EZP_CK high to EZP_D input invalid (hold) EZP_CK low to EZP_Q output valid (setup) EZP_CK low to EZP_Q output invalid (hold) EZP_CS negation to EZP_Q tri-state Min. 1.71 2 x tEZP_CK 5 5 2 5 0 Max. 3.6 fSYS/2 fSYS/8 12 12 Unit V MHz MHz ns ns ns ns ns ns ns ns
EZP_CK
EP3 EP4 EP2
EZP_CS
EP7 EP8
EP9
EZP_Q (output)
EP5 EP6
EZP_D (input)
Figure 9. EzPort Timing Diagram

36
Preliminary
6.4.3 Flexbus Switching Specifications

All processor bus timings are synchronous; input setup/hold and output delay are given in respect to the rising edge of a reference clock, FB_CLK. The FB_CLK frequency may be the same as the internal system bus frequency or an integer divider of that frequency. The following timing numbers indicate when data is latched or driven onto the external bus, relative to the Flexbus output clock (FB_CLK). All other timing relationships can be derived from these values.
Table 25. Flexbus limited range switching specifications
Num Description Operating voltage Frequency of operation FB1 FB2 FB3 FB4 FB5 Clock period Address, data, and control output valid Address, data, and control output hold Data and FB_TA input setup Data and FB_TA input hold Min. 2.7 20 0.5 8.5 0.5 Max. 3.6 50 11.5 Unit V MHz ns ns ns ns ns 1 1 2 2 Notes
1. Specification is valid for all FB_AD[31:0], FB_BE/BWEn, FB_CSn, FB_OE, FB_R/W,FB_TBST, FB_TSIZ[1:0], FB_ALE, and FB_TS. 2. Specification is valid for all FB_AD[31:0] and FB_TA.
Table 26. Flexbus full range switching specifications

Num Description Operating voltage Frequency of operation FB1 FB2 FB3 FB4 FB5 Clock period Address, data, and control output valid Address, data, and control output hold Data and FB_TA input setup Data and FB_TA input hold Min. 1.71 TBD 0 13.7 0.5 Max. 3.6 TBD 13.5 Unit V MHz ns ns ns ns ns 1 1 2 2 Notes
1. Specification is valid for all FB_AD[31:0], FB_BE/BWEn, FB_CSn, FB_OE, FB_R/W,FB_TBST, FB_TSIZ[1:0], FB_ALE, and FB_TS. 2. Specification is valid for all FB_AD[31:0] and FB_TA.

Preliminary
37
FB1
FB_CLK
FB3 FB5
FB_A[Y]
FB2
Address FB4 Data
FB_D[X] FB_RW FB_TS FB_ALE
Address
AA=1
FB_CSn FB_OEn
FB4
AA=0
FB_BEn
FB5
AA=1
FB_TA FB_TSIZ[1:0]
AA=0
TSIZ
Figure 10. FlexBus read timing diagram

38
Preliminary
FB1
FB_CLK
FB2 FB3 Address
FB_A[Y] FB_D[X] FB_RW FB_TS FB_ALE
Address
Data
AA=1
FB_CSn FB_OEn
FB4
AA=0
FB_BEn
FB5
AA=1
FB_TA FB_TSIZ[1:0]
AA=0
TSIZ
Figure 11. FlexBus write timing diagram
6.5 Security and integrity modules

There are no specifications necessary for the device's security and integrity modules.
6.6 Analog

Preliminary
39
6.6.1 ADC electrical specifications

The 16-bit accuracy specifications listed in Table 27 and Table 28 are achievable on the differential pins ADCx_DP0, ADCx_DM0, ADCx_DP1, ADCx_DM1, ADCx_DP3, and ADCx_DM3. The ADCx_DP2 and ADCx_DM2 ADC inputs are connected to the PGA outputs and are not direct device pins. Accuracy specifications for these pins are defined in Table 29 and Table 30. All other ADC channels meet the 13-bit differential/12-bit single-ended accuracy specifications. 6.6.1.1
Symbol VDDA VDDA VSSA VREFH VREFL VADIN CADIN
16-bit ADC operating conditions

Description Supply voltage Supply voltage Ground voltage ADC reference voltage high Reference voltage low Input voltage Input capacitance 16 bit modes 8/10/12 bit modes Conditions Absolute Delta to VDD (VDDVDDA) Delta to VSS (VSSVSSA) Min. 1.71 -100 -100 1.13 VSSA VREFL
Table 27. 16-bit ADC operating conditions

Typ.1 0 0 VDDA VSSA 8 4 Max. 3.6 +100 +100 VDDA VSSA VREFH 10 5 Unit V mV mV V V V pF 2 2 Notes
RADIN RAS
Input resistance Analog source resistance 13/12 bit modes fADCK < 4MHz 13 bit modes
k 3
fADCK fADCK
ADC conversion clock frequency ADC conversion clock frequency
4 1.0 18.0 MHz 5 2.0 12.0 MHz
16 bit modes

40
Preliminary
Table 27. 16-bit ADC operating conditions (continued)

Symbol Crate Description ADC conversion rate Conditions 13 bit modes No ADC hardware averaging Continuous conversions enabled, subsequent conversion time Crate ADC conversion rate 16 bit modes No ADC hardware averaging Continuous conversions enabled, subsequent conversion time 1. Typical values assume VDDA = 3.0 V, Temp = 25C, fADCK = 1.0 MHz unless otherwise stated. Typical values are for reference only and are not tested in production. 2. DC potential difference. 3. This resistance is external to MCU. The analog source resistance should be kept as low as possible in order to achieve the best results. The results in this datasheet were derived from a system which has <8 analog source resistance. The RAS/ CAS time constant should be kept to <1ns. 4. In order to use the maximum ADC conversion clock frequency ADHSC bit should be set and the ADLPC should be clear. 5. In order to use the maximum ADC conversion clock frequency ADHSC bit should be set and the ADLPC should be clear. 6. For guidelines and examples of conversion rate calculation please download the ADC calculator tool http:// cache.freescale.com/files/soft_dev_tools/software/app_software/converters/ADC_CALCULATOR_CNV.zip?fpsp=1 7. For guidelines and examples of conversion rate calculation please download the ADC calculator tool http:// cache.freescale.com/files/soft_dev_tools/software/app_software/converters/ADC_CALCULATOR_CNV.zip?fpsp=1
SIMPLIFIED INPUT PIN EQUIVALENT CIRCUIT
Min.
Typ.1
Max.
Unit
Notes 6
20.000
818.330
Ksps
7 37.037 461.467 Ksps
Z ADIN
SIMPLIFIED CHANNEL SELECT CIRCUIT
Z AS R AS V ADIN V AS C AS
Pad leakage due to input protection
R ADIN
ADC SAR ENGINE
R ADIN INPUT PIN
R ADIN
INPUT PIN
R ADIN C ADIN
INPUT PIN
Figure 12. ADC input impedance equivalency diagram

Preliminary
41
6.6.1.2
Symbol IDDA_ADC
Table 28. 16-bit ADC characteristics (VREFH = VDDA, VREFL = VSSA)

Description Supply current ADC asynchronous clock source ADLPC=1, ADHSC=0 ADLPC=1, ADHSC=1 ADLPC=0, ADHSC=0 ADLPC=0, ADHSC=1 Sample Time Conditions1 Min. 0.215 1.2 3.0 2.4 4.4 Typ.2 2.4 4.0 5.2 6.2 Max. 1.7 3.9 7.3 6.1 9.5 Unit mA MHz MHz MHz MHz Notes 3 tADACK = 1/ fADACK
16-bit ADC electrical characteristics
fADACK
See Reference Manual chapter for sample times 13 bit modes <12 bit modes 0.8 0.5 TBD 1 LSB4 ADC conversion clock <12MHz, Max hardware averaging (AVGE = %1, AVGS = %11) ADC conversion clock <12MHz, Max hardware averaging (AVGE = %1, AVGS = %11) Max averaging VADIN = VDDA
TUE
Total unadjusted error
DNL
Differential nonlinearity
13 bit modes <12 bit modes
0.7 0.2
TBD 0.5
LSB4
INL
Integral nonlinearity Full-scale error
13 bit modes <12 bit modes 13 bit modes <12 bit modes
1.0 0.5 0.4 1.0 -1 to 0
TBD TBD TBD TBD 0.5
LSB4
EFS EQ
LSB4
Quantization error
16 bit modes 13 bit modes
LSB4
ENOB
Effective number 16 bit differential mode of bits Avg=32 Avg=1 16 bit single-ended mode Avg=32 Avg=1
5 bits bits
TBD TBD
13.6 13.2
TBD TBD
TBD TBD
bits bits

42
Preliminary
Table 28. 16-bit ADC characteristics (VREFH = VDDA, VREFL = VSSA) (continued)
Symbol SINAD THD Description Signal-to-noise plus distortion Total harmonic distortion Conditions1 See ENOB 16 bit differential mode Avg=32 16 bit single-ended mode Avg=32 SFDR Spurious free dynamic range 16 bit differential mode Avg=32 16 bit single-ended mode Avg=32 EIL Input leakage error TBD TBD 95 TBD IIn RAS dB dB mV IIn = leakage current (refer to the MCU's voltage and current operating ratings) Temp sensor slope VTEMP25 Temp sensor voltage 40C to 105C 25C TBD TBD mV/C mV 94 TBD TBD TBD dB dB 5 Min. Typ.2 Max. Unit dB 5 Notes
6.02 ENOB + 1.76
1. All accuracy numbers assume the ADC is calibrated with VREFH = VDDA 2. Typical values assume VDDA = 3.0 V, Temp = 25C, fADCK = 2.0 MHz unless otherwise stated. Typical values are for reference only and are not tested in production. 3. The ADC supply current depends on the ADC conversion clock speed, conversion rate and the ADLPC bit (low power). For lowest power operation the ADLPC bit should be set, the HSC bit should be clear with 1MHz ADC conversion clock speed. 4. 1 LSB = (VREFH - VREFL)/2N 5. Input data is 1 kHz sine wave.
Figure TBD
Figure 13. Typical TUE vs. ADC conversion rate 12-bit single-ended mode
Figure TBD
Figure 14. Typical ENOB vs. Averaging for 16-bit differential and 16-bit single-ended modes

Preliminary
43
6.6.1.3
Symbol VDDA VREFPGA VADIN VCM RPGAD
16-bit ADC with PGA operating conditions

Description Supply voltage PGA ref voltage Input voltage Input Common Mode range Differential input impedance Gain = 1, 2, 4, 8 Gain = 16, 32 Gain = 64 Conditions Absolute Min. 1.71 Typ.1
Table 29. 16-bit ADC with PGA operating conditions

Max. 3.6 Unit V V V V k IN+ to IN-4 2, 3 Notes
VREF_OU VREF_OU VREF_OU T T T VSSA VSSA 1.25 13 bit modes No ADC hardware averaging Continuous conversions enabled Peripheral clock = 50 MHz 16 bit modes No ADC hardware averaging Continuous conversions enabled Peripheral clock = 50 MHz 37.037 250 18.484 128 64 32 100 VDDA VDDA 450
RAS TS Crate
Analog source resistance ADC sampling time ADC conversion rate
s Ksps
5 6 7
Ksps
1. Typical values assume VDDA = 3.0 V, Temp = 25C, fADCK = 6 MHz unless otherwise stated. Typical values are for reference only and are not tested in production. 2. ADC must be configured to use the internal voltage reference (VREF_OUT) 3. PGA reference is internally connected to the VREF_OUT pin. If the user wishes to drive VREF_OUT with a voltage other than the output of the VREF module, the VREF module must be disabled. 4. For single ended configurations the input impedance of the driven input is RPGAD/2 5. The analog source resistance (RAS), external to MCU, should be kept as minimum as possible. Increased RAS causes drop in PGA gain without affecting other performances. This is not dependent on ADC clock frequency. 6. The minimum sampling time is dependent on input signal frequency and ADC mode of operation. A minimum of 1.25s time should be allowed for Fin=4 kHz at 16-bit differential mode. Recommended ADC setting is: ADLSMP=1, ADLSTS=2 at 8 MHz ADC clock. 7. ADC clock = 18 MHz, ADLSMP = 1, ADLST = 00, ADHSC = 1 8. ADC clock = 12 MHz, ADLSMP = 1, ADLST = 01, ADHSC = 1

44
Preliminary
6.6.1.4
Symbol IDDA_PGA IDC_PGA
16-bit ADC with PGA characteristics

Description Supply current Input DC current Gain =1, VREFPGA=1.2V, VCM=0.5V Gain =64, VREFPGA=1.2V, VCM=0.1V 0.95 1.9 3.8 7.6 15.2 30.0 58.8 TBD Conditions Low power (ADC_PGA[PGALPb]=0) Min.
Table 30. 16-bit ADC with PGA characteristics

Typ.1 420 Max. TBD Unit A A 1.54 0.57 1 2 4 8 16 31.6 63.3 TBD 1.05 2.1 4.2 8.4 16.6 33.2 67.8 4 40 kHz kHz dB VDDA= 3V 100mV, fVDDA= 50Hz, 60Hz VCM= 500mVpp, fVCM= 50Hz, 100Hz Output offset = VOFS*(Gain+1) 5 0 to 50C A A RAS < 100 Notes 2 3
Gain4
PGAG=0 PGAG=1 PGAG=2 PGAG=3 PGAG=4 PGAG=5 PGAG=6
BW
Input signal bandwidth Power supply rejection ratio
16-bit modes < 16-bit modes Gain=1
PSRR
CMRR
Common mode rejection ratio
Gain=1 Gain=64
TBD TBD
TBD TBD
dB dB
VOFS TGSW dG/dT
Input offset voltage Gain switching settling time Gain drift over temperature Offset drift over temperature Gain drift over supply voltage Gain=1 Gain=64 Gain=1 Gain=1 Gain=64
0.2 TBD TBD TBD TBD TBD
TBD 10 TBD TBD TBD TBD TBD
mV s ppm/C ppm/C ppm/C %/V %/V
dVOFS/dT dG/dVDDA
0 to 50C, ADC Averaging=32 VDDA from 1.71 to 3.6V

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45
Table 30. 16-bit ADC with PGA characteristics (continued)

Symbol EIL Description Input leakage error Conditions All modes Min. Typ.1 IIn RAS Max. Unit mV Notes IIn = leakage current (refer to the MCU's voltage and current operating ratings) VPP,DIFF Maximum differential input signal swing Signal-to-noise ratio Gain=1 Gain=64 V where VX = VREFPGA 0.583 TBD TBD 83.0 57.5 dB dB 16-bit differential mode, Average=32 16-bit differential mode, Average=32, fin=500Hz 16-bit differential mode, Average=32, fin=500Hz 16-bit differential mode,fin=100H z 6
SNR
THD
Total harmonic distortion
Gain=1 Gain=64
TBD TBD
89.4 90.0
dB dB
SFDR
Spurious free dynamic range
Gain=1 Gain=64
TBD TBD
90.9 77.0
dB dB
ENOB
Effective number of bits
Gain=1, Average=4 Gain=1, Average=8 Gain=64, Average=4 Gain=64, Average=8 Gain=1, Average=32 Gain=2, Average=32 Gain=4, Average=32 Gain=8, Average=32 Gain=16, Average=32 Gain=32, Average=32 Gain=64, Average=32
TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD TBD
12.3 12.7 8.4 8.7 13.3 13.1 12.5 11.8 11.1 10.2 9.3
bits bits bits bits bits bits bits bits bits bits bits dB
SINAD
Signal-to-noise plus distortion ratio
See ENOB
6.02 ENOB + 1.76
1. Typical values assume VDDA =3.0V, Temp=25C, fADCK=6MHz unless otherwise stated. 2. This current is a PGA module adder, in addition to and ADC conversion currents. 3. Between IN+ and IN-. The PGA draws a DC current from the input terminals. The magnitude of the DC current is a strong function of input common mode voltage (VCM) and the PGA gain. 4. Gain = 2PGAG 5. After changing the PGA gain setting, a minimum of 2 ADC+PGA conversions should be ignored.

46
Preliminary
Peripheral operating requirements and behaviors 6. Limit the input signal swing so that the PGA does not saturate during operation. Input signal swing is dependent on the PGA reference voltage and gain setting.
6.6.2 CMP and 6-bit DAC electrical specifications

Table 31. Comparator and 6-bit DAC electrical specifications
Symbol VDD IDDHS IDDLS VAIN VAIO VH Description Supply voltage Supply current, High-speed mode (EN=1, PMODE=1) Supply current, low-speed mode (EN=1, PMODE=0) Analog input voltage Analog input offset voltage Analog comparator hysteresis1 CR0[HYSTCTR] = 00 CR0[HYSTCTR] = 01 CR0[HYSTCTR] = 10 CR0[HYSTCTR] = 11 VCMPOh VCMPOl tDHS tDLS Output high Output low Propagation delay, high-speed mode (EN=1, PMODE=1) Propagation delay, low-speed mode (EN=1, PMODE=0) Analog comparator initialization delay2 IDAC6b INL DNL 6-bit DAC current adder (enabled) 6-bit DAC integral non-linearity 6-bit DAC differential non-linearity VDD 0.5 20 120 0.5 0.3 5 10 20 30 50 250 7 0.5 200 600 40 0.5 0.3 mV mV mV mV V V ns ns s A LSB3 LSB Min. 1.71 VSS 0.3 Typ. Max. 3.6 200 20 VDD 20 Unit V A A V mV
1. Typical hysteresis is measured with input voltage range limited to 0.6 to VDD-0.6V. 2. Comparator initialization delay is defined as the time between software writes to change control inputs (Writes to DACEN, VRSEL, PSEL, MSEL, VOSEL) and the comparator output settling to a stable level. 3. 1 LSB = Vreference/64

Preliminary
47
0.08 0.07 0.06 0.05

CM P Hystereris (V)
HYSTCTR Setting
00 01
10
0.04 0.03 0.02 0.01 0
11
0.1
0.4
0.7
1.3
Vin level (V)
1.6
1.9
2.2
2.5
2.8
3.1
Figure 15. Typical hysteresis vs. Vin level (VDD=3.3V, PMODE=0)

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Preliminary
0.18 0.16 0.14 0.12

CMP Hystereris (V) P
HYSTCTR Setting
00 01 10 11
0.1 0.08 0 08 0.06 0.04 0.02 0
0.1
0.4
0.7
1.3
Vin level (V)
1.6
1.9
2.2
2.5
2.8
3.1
Figure 16. Typical hysteresis vs. Vin level (VDD=3.3V, PMODE=1)
6.6.3 12-bit DAC electrical characteristics

6.6.3.1
Symbol VDDA VDACR TA CL IL
12-bit DAC operating requirements

Desciption Supply voltage Reference voltage Temperature Output load capacitance Output load current
Table 32. 12-bit DAC operating requirements

Min. 1.71 1.13 40 Max. 3.6 3.6 105 100 1 Unit V V C pF mA 2 1 Notes
1. The DAC reference can be selected to be VDDA or the voltage output of the VREF module (VREF_OUT) 2. A small load capacitance (47 pF) can improve the bandwidth performance of the DAC

Preliminary
49
6.6.3.2
Symbol
12-bit DAC operating behaviors

Description
Table 33. 12-bit DAC operating behaviors

Min. VDACR 100 60 3.7 TBD Typ. 100 15 0.7 0.4 0.1 Max. 150 700 200 30 1 100 VDACR 8 1 1 0.8 0.6 90 TBD 250 Unit A A s s s mV mV LSB LSB LSB %FSR %FSR dB V/C ppm of FSR/C V/yr V/s 1.2 0.05 1.7 0.12 -80 dB kHz 550 40 6 2 3 4 5 5 1 1 1 Notes
IDDA_DACLP Supply current low-power mode IDDA_DACH Supply current high-speed mode
P
tDACLP tDACHP tCCDACLP Vdacoutl Vdacouth INL DNL DNL VOFFSET EG PSRR TCO TGE AC Rop SR
Full-scale settling time (0x080 to 0xF7F) lowpower mode Full-scale settling time (0x080 to 0xF7F) highpower mode Code-to-code settling time (0xBF8 to 0xC08) low-power mode and high-speed mode DAC output voltage range low high-speed mode, no load, DAC set to 0x000 DAC output voltage range high high-speed mode, no load, DAC set to 0xFFF Integral non-linearity error high speed mode Differential non-linearity error VDACR > 2 V Differential non-linearity error VDACR = VREF_OUT Offset error Gain error Power supply rejection ratio, VDDA > = 2.4 V Temperature coefficient offset voltage Temperature coefficient gain error Offset aging coefficient Output resistance load = 3 k Slew rate -80h F7Fh 80h High power (SPHP) Low power (SPLP)
CT BW
Channel to channel cross talk 3dB bandwidth High power (SPHP) Low power (SPLP)
1. 2. 3. 4. 5.
Settling within 1 LSB The INL is measured for 0+100mV to VDACR100 mV The DNL is measured for 0+100 mV to VDACR100 mV The DNL is measured for 0+100mV to VDACR100 mV with VDDA > 2.4V Calculated by a best fit curve from VSS+100 mV to VDACR100 mV

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Preliminary
Peripheral operating requirements and behaviors 6. VDDA = 3.0V, reference select set for VDDA (DACx_CO:DACRFS = 1), high power mode(DACx_C0:LPEN = 0), DAC set to 0x800, Temp range from -40C to 105C
Figure 17. Typical INL error vs. digital code

Preliminary
51
Figure 18. Offset at half scale vs. temperature
6.6.4 Voltage reference electrical specifications

Table 34. VREF full-range operating requirements
Symbol VDDA TA CL Description Supply voltage Temperature Output load capacitance Min. 1.71 40 Max. 3.6 105 100 Unit V C nF Notes
Table 35. VREF full-range operating behaviors

Symbol Vout Description Voltage reference output with factory trim at nominal VDDA and temperature=25C Min. TBD Typ. 1.2 Max. TBD Unit V Notes

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Preliminary
Table 35. VREF full-range operating behaviors (continued)

Symbol Vout Vout Vstep Vdrift Ac Ibg Itr VLOAD Description Voltage reference output with factory trim Voltage reference output user trim Voltage reference trim step Temperature drift (Vmax -Vmin across the full temperature range) Aging coefficient Bandgap only (MODE_LV = 00) current Tight-regulation buffer (MODE_LV =10) current Load regulation (MODE_LV = 10) current = + 1.0 mA current = - 1.0 mA Tstup DC Buffer startup time Line regulation (power supply rejection) 60 TBD TBD 100 TBD TBD s mV dB Min. TBD 1.198 Typ. 0.5 Max. TBD 1.202 40 TBD TBD 1.1 Unit V V mV mV ppm/year A mA mV 1 See Figure 19 Notes
1. Load regulation voltage is the difference between the VREF_OUT voltage with no load vs. voltage with defined load
Table 36. VREF limited-range operating requirements

Symbol TA Description Temperature Min. 0 Max. 50 Unit C Notes
Table 37. VREF limited-range operating behaviors

Symbol Vout Description Voltage reference output with factory trim Min. TBD Max. TBD Unit V Notes
TBD
Figure 19. Typical output vs.temperature
TBD
Figure 20. Typical output vs. VDD
6.7 Timers
See General switching specifications.
Preliminary
53
6.8 Communication interfaces

6.8.1 USB electrical specifications
The USB electricals for the USB On-the-Go module conform to the standards documented by the Universal Serial Bus Implementers Forum. For the most up-to-date standards, visit http://www.usb.org.
6.8.2 USB DCD electrical specifications

Table 38. USB DCD electrical specifications
Symbol VDP_SRC VLGC IDP_SRC IDM_SINK RDM_DWN VDAT_REF Description USB_DP source voltage (up to 250 A) Threshold voltage for logic high USB_DP source current USB_DM sink current D- pulldown resistance for data pin contact detect Data detect voltage Min. TBD 0.8 7 50 14.25 0.25 Typ. TBD 10 100 TBD Max. TBD 2.0 13 150 24.8 0.4 Unit V V A A k V
6.8.3 USB VREG electrical specifications

Table 39. USB VREG electrical specifications
Symbol VREGIN IDDon IDDstby IDDoff Description Input supply voltage Quiescent current Run mode, load current equal zero, input supply (VREGIN) > 3.6 V Quiescent current Standby mode, load current equal zero Quiescent current Shutdown mode VREGIN = 5.0 V and temperature=25C Across operating voltage and temperature ILOADrun ILOADstby Maximum load current Run mode Maximum load current Standby mode 500 TBD 120 1 nA A mA mA Min. 2.7 Typ. 120 1 Max. 5.5 TBD TBD Unit V A A Notes

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Preliminary
Table 39. USB VREG electrical specifications (continued)

Symbol VReg33out Description Regulator output voltage Input supply (VREGIN) > 3.6 V Run mode Standby mode VReg33out COUT ESR ILIM Regulator output voltage Input supply (VREGIN) < 3.6 V, pass-through mode External output capacitor External output capacitor equivalent series resistance Short circuit current 3 TBD TBD 1.76 1 TBD 3.3 2.8 2.2 290 3.6 3.6 3.6 8.16 100 TBD V V V F m mA 1 Min. Typ. Max. Unit Notes
1. Operating in pass-through mode: regulator output voltage equal to the input voltage minus a drop proportional to ILoad.
6.8.4 CAN switching specifications

6.8.5 DSPI switching specifications (low-speed mode)

The DMA Serial Peripheral Interface (DSPI) provides a synchronous serial bus with master and slave operations. Many of the transfer attributes are programmable. The tables below provides DSPI timing characteristics for classic SPI timing modes. Refer to the DSPI chapter of the Reference Manual for information on the modified transfer formats used for communicating with slower peripheral devices.
Table 40. Master mode DSPI timing (low-speed mode)
Num Operating voltage Frequency of operation DS1 DS2 DS3 DS4 DS5 DSPI_SCK output cycle time DSPI_SCK output high/low time DSPI_PCSn valid to DSPI_SCK delay DSPI_SCK to DSPI_PCSn invalid delay DSPI_SCK to DSPI_SOUT valid Description Min. 1.71 4 x tBUS (tSCK/2) - 4 (tBUS x 2) 4 (tBUS x 2) 4 Max. 3.6 12.5 (tSCK/2) + 4 10 Unit V MHz ns ns ns ns ns 2 3 Notes 1

Preliminary
55
Table 40. Master mode DSPI timing (low-speed mode) (continued)

Num DS6 DS7 DS8 Description DSPI_SCK to DSPI_SOUT invalid DSPI_SIN to DSPI_SCK input setup DSPI_SCK to DSPI_SIN input hold Min. -2 15 0 Max. Unit ns ns ns Notes
1. The DSPI module can operate across the entire operating voltage for the processor, but to run across the full voltage range the maximum frequency of operation is reduced. 2. The delay is programmable in SPIx_CTARn[PSSCK] and SPIx_CTARn[CSSCK]. 3. The delay is programmable in SPIx_CTARn[PASC] and SPIx_CTARn[ASC].
DSPI_PCSn
DS3 DS2 DS1 DS4
DSPI_SCK (CPOL=0) DSPI_SIN

DS7 DS8
First data DS5
Data DS6 Data
Last data
DSPI_SOUT
First data
Last data
Figure 21. DSPI classic SPI timing master mode Table 41. Slave mode DSPI timing (low-speed mode)
Num Operating voltage Frequency of operation DS9 DS10 DS11 DS12 DS13 DS14 DS15 DS16 DSPI_SCK input cycle time DSPI_SCK input high/low time DSPI_SCK to DSPI_SOUT valid DSPI_SCK to DSPI_SOUT invalid DSPI_SIN to DSPI_SCK input setup DSPI_SCK to DSPI_SIN input hold DSPI_SS active to DSPI_SOUT driven DSPI_SS inactive to DSPI_SOUT not driven Description Min. 1.71 8 x tBUS (tSCK/2) - 4 0 5 15 Max. 3.6 6.25 (tSCK/2) + 4 20 19 19 Unit V MHz ns ns ns ns ns ns ns ns

56
Preliminary
DSPI_SS
DS10 DS9
DSPI_SCK (CPOL=0) DSPI_SOUT

DS13 DS15 DS12 First data DS14 First data Data Last data DS11 Data Last data DS16
DSPI_SIN
Figure 22. DSPI classic SPI timing slave mode
6.8.6 DSPI switching specifications (high-speed mode)

The DMA Serial Peripheral Interface (DSPI) provides a synchronous serial bus with master and slave operations. Many of the transfer attributes are programmable. The tables below provide DSPI timing characteristics for classic SPI timing modes. Refer to the DSPI chapter of the Reference Manual for information on the modified transfer formats used for communicating with slower peripheral devices.
Table 42. Master mode DSPI timing (high-speed mode)
Num Operating voltage Frequency of operation DS1 DS2 DS3 DS4 DS5 DS6 DS7 DS8 DSPI_SCK output cycle time DSPI_SCK output high/low time DSPI_PCSn valid to DSPI_SCK delay DSPI_SCK to DSPI_PCSn invalid delay DSPI_SCK to DSPI_SOUT valid DSPI_SCK to DSPI_SOUT invalid DSPI_SIN to DSPI_SCK input setup DSPI_SCK to DSPI_SIN input hold Description Min. 2.7 2 x tBUS (tSCK/2) 2 (tBUS x 2) 2 (tBUS x 2) 2 2 TBD 0 Max. 3.6 25 (tSCK/2) + 2 8.5 Unit V MHz ns ns ns ns ns ns ns ns 1 2 Notes
1. The delay is programmable in SPIx_CTARn[PSSCK] and SPIx_CTARn[CSSCK]. 2. The delay is programmable in SPIx_CTARn[PASC] and SPIx_CTARn[ASC].

Preliminary
57
DSPI_PCSn
DS3 DS2 DS1 DS4
DSPI_SCK (CPOL=0) DSPI_SIN

DS7 DS8
First data DS5
Data DS6 Data
Last data
DSPI_SOUT
First data
Last data
Figure 23. DSPI classic SPI timing master mode Table 43. Slave mode DSPI timing (high-speed mode)
Num Operating voltage Frequency of operation DS9 DS10 DS11 DS12 DS13 DS14 DS15 DS16 DSPI_SCK input cycle time DSPI_SCK input high/low time DSPI_SCK to DSPI_SOUT valid DSPI_SCK to DSPI_SOUT invalid DSPI_SIN to DSPI_SCK input setup DSPI_SCK to DSPI_SIN input hold DSPI_SS active to DSPI_SOUT driven DSPI_SS inactive to DSPI_SOUT not driven 4 x tBUS (tSCK/2) 2 0 2 7 Description Min. 2.7 Max. 3.6 12.5 (tSCK/2 + 2 10 14 14 Unit V MHz ns ns ns ns ns ns ns ns
DSPI_SS
DS10 DS9
DSPI_SCK (CPOL=0) DSPI_SOUT

DS13 DS15 DS12 First data DS14 First data Data Last data DS11 Data Last data DS16
DSPI_SIN
Figure 24. DSPI classic SPI timing slave mode

58
Preliminary
6.8.7 I2C switching specifications

6.8.8 UART switching specifications

6.8.9 SDHC specifications

The following timing specs are defined at the chip I/O pin and must be translated appropriately to arrive at timing specs/constraints for the physical interface.
Table 44. SDHC switching specifications
Num Symbol Description Operating voltage Card input clock SD1 fpp fpp fpp fOD SD2 SD3 SD4 SD5 tWL tWH tTLH tTHL Clock frequency (low speed) Clock frequency (SD\SDIO full speed) Clock frequency (MMC full speed) Clock frequency (identification mode) Clock low time Clock high time Clock rise time Clock fall time 0 0 0 0 7 7 400 25 20 400 3 3 kHz MHz MHz kHz ns ns ns ns Min. 2.7 Max. 3.6 Unit V
SDHC output / card inputs SDHC_CMD, SDHC_DAT (reference to SDHC_CLK) SD6 tOD SDHC output delay (output valid) -5 6.5 ns
SDHC input / card inputs SDHC_CMD, SDHC_DAT (reference to SDHC_CLK) SD7 SD8 tISU tIH SDHC input setup time SDHC input hold time 5 0 ns ns

Preliminary
59

SD3 SD2 SD1
SDHC_CLK
SD6
Output SDHC_CMD
Output SDHC_DAT[3:0]
SD7 SD8
Input SDHC_CMD
Input SDHC_DAT[3:0]
Figure 25. SDHC timing
6.8.10 I2S switching specifications

This section provides the AC timings for the I2S in master (clocks driven) and slave modes (clocks input). All timings are given for non-inverted serial clock polarity (TCR[TSCKP] = 0, RCR[RSCKP] = 0) and a non-inverted frame sync (TCR[TFSI] = 0, RCR[RFSI] = 0). If the polarity of the clock and/or the frame sync have been inverted, all the timings remain valid by inverting the clock signal (I2S_BCLK) and/or the frame sync (I2S_FS) shown in the figures below.
Table 45. I2S master mode timing
Num Description Operating voltage S1 S2 S3 S4 S5 S6 S7 S8 S9 S10 I2S_MCLK cycle time I2S_MCLK pulse width high/low I2S_BCLK cycle time I2S_BCLK pulse width high/low I2S_BCLK to I2S_FS output valid I2S_BCLK to I2S_FS output invalid I2S_BCLK to I2S_TXD valid I2S_BCLK to I2S_TXD invalid I2S_RXD/I2S_FS input setup before I2S_BCLK I2S_RXD/I2S_FS input hold after I2S_BCLK Min. 2.7 2 x tSYS 45% 5 x tSYS 45% -2.5 -3 20 0 55% 55% 15 15 Max. 3.6 Unit V ns MCLK period ns BCLK period ns ns ns ns ns ns

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Preliminary

S1 S2 S2
I2S_MCLK (output)
S3
I2S_BCLK (output)
S4 S5
S4 S6
I2S_FS (output)
S9 S10
I2S_FS (input)
S7 S8
S7 S8
I2S_TXD
S9 S10
I2S_RXD
Figure 26. I2S timing master mode Table 46. I2S slave mode timing
Num Description Operating voltage S11 S12 S13 S14 S15 S16 S17 S18 I2S_BCLK cycle time (input) I2S_BCLK pulse width high/low (input) I2S_FS input setup before I2S_BCLK I2S_FS input hold after I2S_BCLK I2S_BCLK to I2S_TXD/I2S_FS output valid I2S_BCLK to I2S_TXD/I2S_FS output invalid I2S_RXD setup before I2S_BCLK I2S_RXD hold after I2S_BCLK Min. 2.7 8 x tSYS 45% 10 3 0 10 2 Max. 3.6 55% 20 Unit V ns MCLK period ns ns ns ns ns ns

Preliminary
61

S11 S12
I2S_BCLK (input)
S15
S12 S16
I2S_FS (output)
S13 S14
I2S_FS (input)
S15 S16
S15 S16
I2S_TXD
S17 S18
I2S_RXD
Figure 27. I2S timing slave modes
6.9 Human-machine interfaces (HMI)

6.9.1 TSI electrical specifications
Table 47. TSI electrical specifications
Symbol VDDTSI CELE fREFmax fELEmax CREF VDELTA IREF IELE Pres5 Pres20 Pres100 Description Operating voltage Target electrode capacitance range Reference oscillator frequency Electrode oscillator frequency Internal reference capacitor Oscillator delta voltage Reference oscillator current source base current Electrode oscillator current source base current Electrode capacitance measurement precision Electrode capacitance measurement precision Electrode capacitance measurement precision Min. 1.71 1 TBD TBD 0.003 0.003 8 Typ. 20 5.5 0.5 1 600 1.133 1.133 TBD TBD TBD 0.25 15 Max. 3.6 500 TBD TBD TBD TBD TBD TBD TBD TBD TBD 16 25 Unit V pF MHz MHz pF mV A A % % % fF/count fF/count bits s 11 4 3, 5 3, 5 6 7 8 9 10 1 2 3 Notes
MaxSens2 Maximum sensitivity @ 20 pF electrode 0 MaxSens Res TCon20 Maximum sensitivity Resolution Response time @ 20 pF

62
Preliminary
Dimensions
Table 47. TSI electrical specifications (continued)

Symbol ITSI_RUN ITSI_LP 1. 2. 3. 4. 5. 6. 7. 8. 9. Description Current added in run mode Low power mode current adder Min. Typ. 55 1.3 Max. TBD Unit A A 12 Notes
The TSI module is functional with capacitance values outside this range. However, optimal performance is not guaranteed. CAPTRM=7, DELVOL=7, and fixed external capacitance of 20 pF. CAPTRM=0, DELVOL=2, and fixed external capacitance of 20 pF. CAPTRM=0, EXTCHRG=9, and fixed external capacitance of 20 pF. The programmable current source value is generated by multiplying the SCANC[REFCHRG] value and the base current. Measured with a 5 pF electrode, reference oscillator frequency of 10 MHz, PS = 128, NSCN = 8; Iext = 16. Measured with a 20 pF electrode, reference oscillator frequency of 10 MHz, PS = 128, NSCN = 2; Iext = 16. Measured with a 20 pF electrode, reference oscillator frequency of 10 MHz, PS = 16, NSCN = 3; Iext = 16. Measured with a 20 pF electrode, reference oscillator frequency of ~5 MHz (IREF = 5 A, REFCHRG = 4), PS = 128, NSCN = 2; Iext = 16 (EXTCHRG = 15). 10. Typical value depends on the configuration used. 11. Time to do one complete measurement of the electrode. Sensitivity resolution of 0.0133 pF, PS = 0, NSCN = 0, 1 electrode, DELVOL = 2, EXTCHRG = 15. 12. CAPTRM=7, DELVOL=2, REFCHRG=0, EXTCHRG=4, PS=7, NSCN=0F, LPSCNITV=F, LPO is selected (1 kHz), and fixed external capacitance of 20 pF. Data is captured with an average of 7 periods window.
7 Dimensions
7.1 Obtaining package dimensions
Package dimensions are provided in package drawings. To find a package drawing, go to http://www.freescale.com and perform a keyword search for the drawings document number:
If you want the drawing for this package 144-pin LQFP 144-pin MAPBGA Then use this document number 98ASS23177W 98ASA00222D
8 Pinout
8.1 K20 Signal Multiplexing and Pin Assignments
The following table shows the signals available on each pin and the locations of these pins on the devices supported by this document. The Port Control Module is responsible for selecting which ALT functionality is available on each pin.
Preliminary
63
Pinout 144 144 LQF MAP P BGA 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 L5 M5 Pin Name Default ALT0 ALT1 ALT2 ALT3 ALT4 ALT5 ALT6 ALT7 EzPort
RESERVED RESERVED RESERVED NC NC NC NC NC ADC1_SE4 a ADC1_SE5 a ADC1_SE6 a ADC1_SE7 a VDD VSS DISABLED DISABLED DISABLED DISABLED DISABLED DISABLED DISABLED DISABLED DISABLED VDD VSS VSS USB0_DP USB0_DM VOUT33 VREGIN ADC0_DP1 ADC1_DP1 VDD VSS VSS USB0_DP USB0_DM VOUT33 VREGIN ADC0_DP1 ADC1_DP1 NC NC NC NC ADC1_SE4 a ADC1_SE5 a ADC1_SE6 a ADC1_SE7 a VDD VSS PTE4 PTE5 PTE6 PTE7 PTE8 PTE9 PTE10 PTE11 PTE12 SPI1_PCS0 UART3_TX SPI1_PCS2 UART3_RX SPI1_PCS3 UART3_CT S_b UART3_RT S_b UART5_TX UART5_RX UART5_CT S_b UART5_RT S_b SDHC0_D3 SDHC0_D2 I2S0_MCLK I2S0_RXD I2S0_RX_F S I2S0_RX_B CLK I2S0_TXD I2S0_TX_F S I2S0_TX_B CLK I2S0_CLKIN PTE0 PTE1 PTE2 PTE3 SPI1_PCS1 UART1_TX SPI1_SOUT UART1_RX SPI1_SCK SPI1_SIN UART1_CT S_b UART1_RT S_b SDHC0_D1 SDHC0_D0 SDHC0_DC LK SDHC0_CM D I2C1_SDA I2C1_SCL
A10 NC B10 NC C10 NC D3 D2 D1 E4 E5 F6 E3 E2 E1 F4 F3 F2 F1 G4 G3 E6 F7 H3 H1 H2 G1 G2 J1 J2 K1 K2 PTE0 PTE1 PTE2 PTE3 VDD VSS PTE4 PTE5 PTE6 PTE7 PTE8 PTE9 PTE10 PTE11 PTE12 VDD VSS VSS USB0_DP USB0_DM VOUT33 VREGIN ADC0_DP1 ADC1_DP1
ADC0_DM1 ADC0_DM1 ADC0_DM1 ADC1_DM1 ADC1_DM1 ADC1_DM1

64
Preliminary
Pinout 144 144 LQF MAP P BGA 27 L1 Pin Name Default ALT0 ALT1 ALT2 ALT3 ALT4 ALT5 ALT6 ALT7 EzPort
PGA0_DP/ PGA0_DP/ PGA0_DP/ ADC0_DP0/ ADC0_DP0/ ADC0_DP0/ ADC1_DP3 ADC1_DP3 ADC1_DP3 PGA0_DM/ PGA0_DM/ PGA0_DM/ ADC0_DM0/ ADC0_DM0/ ADC0_DM0/ ADC1_DM3 ADC1_DM3 ADC1_DM3 PGA1_DP/ PGA1_DP/ PGA1_DP/ ADC1_DP0/ ADC1_DP0/ ADC1_DP0/ ADC0_DP3 ADC0_DP3 ADC0_DP3 PGA1_DM/ PGA1_DM/ PGA1_DM/ ADC1_DM0/ ADC1_DM0/ ADC1_DM0/ ADC0_DM3 ADC0_DM3 ADC0_DM3 VDDA VREFH VREFL VSSA ADC1_SE1 6/ CMP2_IN2/ ADC0_SE2 2 ADC0_SE1 6/ CMP1_IN2/ ADC0_SE2 1 VREF_OUT/ CMP1_IN5/ CMP0_IN5/ ADC1_SE1 8 DAC0_OUT/ CMP1_IN3/ ADC0_SE2 3 DAC1_OUT/ CMP2_IN3/ ADC1_SE2 3 XTAL32 EXTAL32 VBAT VDD VSS PTE24 PTE25 VDDA VREFH VREFL VSSA ADC1_SE1 6/ CMP2_IN2/ ADC0_SE2 2 ADC0_SE1 6/ CMP1_IN2/ ADC0_SE2 1 VREF_OUT/ CMP1_IN5/ CMP0_IN5/ ADC1_SE1 8 DAC0_OUT/ CMP1_IN3/ ADC0_SE2 3 DAC1_OUT/ CMP2_IN3/ ADC1_SE2 3 XTAL32 EXTAL32 VBAT VDD VSS ADC0_SE1 7 ADC0_SE1 8 VDDA VREFH VREFL VSSA ADC1_SE1 6/ CMP2_IN2/ ADC0_SE2 2 ADC0_SE1 6/ CMP1_IN2/ ADC0_SE2 1 VREF_OUT/ CMP1_IN5/ CMP0_IN5/ ADC1_SE1 8 DAC0_OUT/ CMP1_IN3/ ADC0_SE2 3 DAC1_OUT/ CMP2_IN3/ ADC1_SE2 3 XTAL32 EXTAL32 VBAT VDD VSS ADC0_SE1 7 ADC0_SE1 8 PTE24 PTE25 CAN1_TX CAN1_RX UART4_TX UART4_RX EWM_OUT _b EWM_IN
28
L2
29
M1
30
M2
31 32 33 34 35
H5 G5 G6 H6 K3
36
J3
37
M3
38
L3
39
L4
40 41 42 43 44 45 46
M7 M6 L6 M4 K5

Preliminary
65
Pinout 144 144 LQF MAP P BGA 47 48 49 50 K4 J4 H4 J5 Pin Name Default ALT0 ALT1 ALT2 ALT3 ALT4 ALT5 ALT6 ALT7 EzPort
PTE26 PTE27 PTE28 PTA0
DISABLED DISABLED DISABLED JTAG_TCL K/ SWD_CLK/ EZP_CLK JTAG_TDI/ EZP_DI TSI0_CH1
PTE26 PTE27 PTE28 PTA0 UART0_CT S_b
UART4_CT S_b UART4_RT S_b FTM0_CH5
RTC_CLKO USB_CLKIN UT
JTAG_TCL K/ SWD_CLK JTAG_TDI
EZP_CLK
51 52
J6 K6
PTA1 PTA2
TSI0_CH2
PTA1 PTA2
UART0_RX UART0_TX
FTM0_CH6 FTM0_CH7
EZP_DI
JTAG_TDO/ TSI0_CH3 TRACE_SW O/EZP_DO JTAG_TMS/ TSI0_CH4 SWD_DIO NMI_b/ EZP_CS_b DISABLED VDD VSS DISABLED ADC0_SE1 0 ADC0_SE1 1 DISABLED DISABLED DISABLED CMP2_IN0 CMP2_IN1 DISABLED DISABLED DISABLED ADC1_SE1 7 VDD VSS ADC1_SE1 7 VDD VSS CMP2_IN0 CMP2_IN1 ADC0_SE1 0 ADC0_SE1 1 VDD VSS TSI0_CH5
JTAG_TDO/ EZP_DO TRACE_SW O JTAG_TMS/ SWD_DIO NMI_b CMP2_OUT I2S0_RX_B CLK JTAG_TRS T EZP_CS_b
53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71
K7 L7 M8 E7 G7 J7 J8 K8 L8 M9 L9 K9 J9
PTA3 PTA4 PTA5 VDD VSS PTA6 PTA7 PTA8 PTA9 PTA10 PTA11 PTA12 PTA13
PTA3 PTA4 PTA5
UART0_RT S_b
FTM0_CH0 FTM0_CH1 FTM0_CH2
PTA6 PTA7 PTA8 PTA9 PTA10 PTA11 PTA12 PTA13 PTA14 PTA15 PTA16 PTA17 CAN0_TX CAN0_RX
FTM0_CH3 FTM0_CH4 FTM1_CH0 FTM1_CH1 FTM2_CH0 FTM2_CH1 FTM1_CH0 FTM1_CH1 FTM1_QD_ PHA FTM1_QD_ PHB FTM2_QD_ PHA FTM2_QD_ PHB I2S0_TXD I2S0_TX_F S I2S0_TX_B CLK I2S0_RXD I2S0_RX_F S
TRACE_CL KOUT TRACE_D3 TRACE_D2 TRACE_D1 TRACE_D0
FTM1_QD_ PHA FTM1_QD_ PHB
L10 PTA14 L11 PTA15 K10 PTA16 K11 PTA17 E8 G8 VDD VSS
SPI0_PCS0 UART0_TX SPI0_SCK UART0_RX
SPI0_SOUT UART0_CT S_b SPI0_SIN UART0_RT S_b
I2S0_MCLK I2S0_CLKIN

66
Preliminary
Pinout 144 144 LQF MAP P BGA 72 73 74 75 76 77 78 79 80 81 Pin Name Default ALT0 ALT1 ALT2 ALT3 ALT4 ALT5 ALT6 ALT7 EzPort
M12 PTA18 M11 PTA19 L12 RESET_b K12 PTA24 J12 J11 J10 PTA25 PTA26 PTA27
EXTAL XTAL RESET_b DISABLED DISABLED DISABLED DISABLED DISABLED DISABLED / ADC0_SE8/ ADC1_SE8/ TSI0_CH0 / ADC0_SE9/ ADC1_SE9/ TSI0_CH6
EXTAL XTAL RESET_b
PTA18 PTA19
FTM0_FLT2 FTM_CLKIN 0 FTM1_FLT0 FTM_CLKIN 1 LPT0_ALT1
PTA24 PTA25 PTA26 PTA27 PTA28 PTA29 / PTB0 ADC0_SE8/ ADC1_SE8/ TSI0_CH0 / PTB1 ADC0_SE9/ ADC1_SE9/ TSI0_CH6 I2C0_SCL FTM1_CH0
FB_A29 FB_A28 FB_A27 FB_A26 FB_A25 FB_A24 FTM1_QD_ PHA
H12 PTA28 H11 PTA29 H10 PTB0
82
H9
PTB1
I2C0_SDA
FTM1_CH1
FTM1_QD_ PHB
83
G12 PTB2
/ / PTB2 ADC0_SE1 ADC0_SE1 2/TSI0_CH7 2/TSI0_CH7 / / PTB3 ADC0_SE1 ADC0_SE1 3/TSI0_CH8 3/TSI0_CH8 / ADC1_SE1 0 / ADC1_SE1 1 / ADC1_SE1 2 / ADC1_SE1 3 / ADC1_SE1 0 / ADC1_SE1 1 / ADC1_SE1 2 / ADC1_SE1 3 PTB4
I2C0_SCL
UART0_RT S_b UART0_CT S_b
FTM0_FLT3
84
G11 PTB3
I2C0_SDA
FTM0_FLT0
85
G10 PTB4
FTM1_FLT0
86
G9
PTB5
PTB5
FTM2_FLT0
87
F12 PTB6
PTB6
FB_AD23
88
F11 PTB7
PTB7
FB_AD22
89 90 91
F10 PTB8 F9 PTB9 / ADC1_SE1 4 / ADC1_SE1 5 VSS / ADC1_SE1 4 / ADC1_SE1 5 VSS
PTB8 PTB9 PTB10
UART3_RT S_b SPI1_PCS1 UART3_CT S_b SPI1_PCS0 UART3_RX
FB_AD21 FB_AD20 FB_AD19 FTM0_FLT1
E12 PTB10
92
E11 PTB11
PTB11
SPI1_SCK
UART3_TX
FB_AD18
FTM0_FLT2
93
H7
VSS

Preliminary
67
Pinout 144 144 LQF MAP P BGA 94 95 96 97 98 99 100 101 102 103 F5 E9 Pin Name Default ALT0 ALT1 ALT2 ALT3 ALT4 ALT5 ALT6 ALT7 EzPort
VDD PTB17
VDD /TSI0_CH9
VDD /TSI0_CH9 PTB16 SPI1_SOUT UART0_RX SPI1_SIN CAN0_TX CAN0_RX SPI2_PCS0 SPI2_SCK SPI2_SOUT SPI2_SIN SPI0_PCS5 I2S0_TXD SPI0_PCS4 PDB0_EXT RG UART0_TX FTM2_CH0 FTM2_CH1 I2S0_TX_B CLK I2S0_TX_F S FB_AD17 FB_AD16 FB_AD15 FB_OE_b FB_AD31 FB_AD30 FB_AD29 FB_AD28 FB_AD14 EWM_IN EWM_OUT _b FTM2_QD_ PHA FTM2_QD_ PHB CMP0_OUT CMP1_OUT CMP2_OUT
E10 PTB16
/TSI0_CH10 /TSI0_CH10 PTB17 /TSI0_CH11 /TSI0_CH11 PTB18 /TSI0_CH12 /TSI0_CH12 PTB19 PTB20 PTB21 PTB22 PTB23 / ADC0_SE1 4/ TSI0_CH13 / ADC0_SE1 5/ TSI0_CH14 / ADC0_SE4 b/ CMP1_IN0/ TSI0_CH15 /CMP1_IN1 VSS VDD / ADC0_SE1 4/ TSI0_CH13 / ADC0_SE1 5/ TSI0_CH14 / ADC0_SE4 b/ CMP1_IN0/ TSI0_CH15 /CMP1_IN1 VSS VDD PTC4 PTC5 /CMP0_IN0 /CMP0_IN1 / ADC1_SE4 b/ CMP0_IN2 / ADC1_SE5 b/ CMP0_IN3 / ADC1_SE6 b/ CMP0_IN4 /CMP0_IN0 /CMP0_IN1 / ADC1_SE4 b/ CMP0_IN2 / ADC1_SE5 b/ CMP0_IN3 / ADC1_SE6 b/ CMP0_IN4 PTC6 PTC7 PTC8 PTC0
D12 PTB18 D11 PTB19 D10 PTB20 D9 PTB21 C12 PTB22 C11 PTB23 B12 PTC0
104
B11 PTC1
PTC1
SPI0_PCS3 UART1_RT S_b
FTM0_CH0
FB_AD13
105
A12 PTC2
PTC2
SPI0_PCS2 UART1_CT S_b
FTM0_CH1
FB_AD12
106 107 108 109 110 111 112 113
A11 PTC3 H8 A9 D8 C8 B8 A8 VSS VDD PTC4 PTC5 PTC6 PTC7 PTC8
PTC3
SPI0_PCS1 UART1_RX
FTM0_CH2
FB_CLKOU T
SPI0_PCS0 UART1_TX SPI0_SCK SPI0_SOUT PDB0_EXT RG SPI0_SIN
FTM0_CH3
FB_AD11 FB_AD9 FB_AD8
CMP1_OUT CMP0_OUT
LPT0_ALT2 FB_AD10
I2S0_MCLK I2S0_CLKIN FB_AD7
114
D7
PTC9
PTC9
I2S0_RX_B CLK
FB_AD6
FTM2_FLT0
115
C7
PTC10
PTC10
I2C1_SCL
I2S0_RX_F S
FB_AD5

68
Preliminary
Pinout 144 144 LQF MAP P BGA 116 B7 Pin Name Default ALT0 ALT1 ALT2 ALT3 ALT4 ALT5 ALT6 ALT7 EzPort
PTC11
/ ADC1_SE7 b
/ ADC1_SE7 b
PTC11
I2C1_SDA
I2S0_RXD
FB_RW_b
117 118 119 120 121 122 123
A7 D6 C6 B6 A6
PTC12 PTC13 PTC14 PTC15 VSS VDD PTC16 VSS VDD VSS VDD
PTC12 PTC13 PTC14 PTC15
UART4_RT S_b UART4_CT S_b UART4_RX UART4_TX
FB_AD27 FB_AD26 FB_AD25 FB_AD24
PTC16
CAN1_RX
UART3_RX
FB_CS5_b/ FB_TSIZ1/ FB_BE23_1 6_BLS15_8 _b FB_CS4_b/ FB_TSIZ0/ FB_BE31_2 4_BLS7_0_ b FB_TBST_b /FB_CS2_b/ FB_BE15_8 _BLS23_16 _b FB_CS3_b/ FB_TA_b FB_BE7_0_ BLS31_24_ b FB_ALE/ FB_CS1_b/ FB_TS_b FB_CS0_b
124
D5
PTC17
PTC17
CAN1_TX
UART3_TX
125
C5
PTC18
PTC18
UART3_RT S_b
126
B5
PTC19
PTC19
UART3_CT S_b
127
A5
PTD0
PTD0
SPI0_PCS0 UART2_RT S_b SPI0_SCK UART2_CT S_b
128
D4
PTD1
/ ADC0_SE5 b
/ ADC0_SE5 b
PTD1
129 130 131 132
C4 B4 A4 A3
PTD2 PTD3 PTD4 PTD5 / ADC0_SE6 b / ADC0_SE7 b VSS VDD / ADC0_SE6 b / ADC0_SE7 b VSS VDD
PTD2 PTD3 PTD4 PTD5
SPI0_SOUT UART2_RX SPI0_SIN UART2_TX FTM0_CH4 FTM0_CH5 SPI0_PCS1 UART0_RT S_b SPI0_PCS2 UART0_CT S_b SPI0_PCS3 UART0_RX
FB_AD4 FB_AD3 FB_AD2 FB_AD1 EWM_IN EWM_OUT _b FTM0_FLT0
133
A2
PTD6
PTD6
FTM0_CH6
FB_AD0
134 135
M10 VSS F8 VDD

Preliminary
69
Pinout 144 144 LQF MAP P BGA 136 137 138 139 140 141 142 143 144 A1 C9 B9 B3 B2 B1 C3 C2 C1 Pin Name Default ALT0 ALT1 ALT2 ALT3 ALT4 ALT5 ALT6 ALT7 EzPort
PTD7 PTD8 PTD9 PTD10 PTD11 PTD12 PTD13 PTD14 PTD15 DISABLED DISABLED DISABLED DISABLED DISABLED DISABLED DISABLED DISABLED
PTD7 PTD8 PTD9 PTD10 PTD11 PTD12 PTD13 PTD14 PTD15
CMT_IRO I2C0_SCL I2C0_SDA
UART0_TX UART5_RX UART5_TX UART5_RT S_b
FTM0_CH7
FTM0_FLT1 FB_A16 FB_A17 FB_A18
SPI2_PCS0 UART5_CT S_b SPI2_SCK SPI2_SOUT SPI2_SIN SPI2_PCS1
SDHC0_CL KIN SDHC0_D4 SDHC0_D5 SDHC0_D6 SDHC0_D7
FB_A19 FB_A20 FB_A21 FB_A22 FB_A23
8.2 K20 Pinouts

The below figure shows the pinout diagram for the devices supported by this document. Many signals may be multiplexed onto a single pin. To determine what signals can be used on which pin, see the previous section.

70
Preliminary
Pinout
PTD15 PTD14 PTD13 PTD12 PTD11 PTD10 PTC19 PTC18 PTC17 PTC16 PTC15 PTC14 PTC13 PTC12 PTC11 PTC10 PTD9 PTD8 PTD7 PTD6 PTD5 PTD4 PTD3 PTD2 PTD1 PTD0 PTC9 PTC8 PTC7 PTC6 111 PTC5 110 PTC4 109 108 106 105 104 103 102 101 100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81 80 79 78 77 76 75 74 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 37 38 39 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 VDD VDD 122 VSS VSS 121
141
142
132
131
139
135
129
125
119
138
136
128
126
118
140
130
144
143
137
134
133
127
124
123
120
117
116
115
114
PTE0 PTE1 PTE2 PTE3 VDD VSS PTE4 PTE5 PTE6 PTE7 PTE8 PTE9 PTE10 PTE11 PTE12 VDD VSS VSS USB0_DP USB0_DM VOUT33 VREGIN ADC0_DP1 ADC0_DM1 ADC1_DP1 ADC1_DM1 PGA0_DP/ADC0_DP0/ADC1_DP3 PGA0_DM/ADC0_DM0/ADC1_DM3 PGA1_DP/ADC1_DP0/ADC0_DP3 PGA1_DM/ADC1_DM0/ADC0_DM3 VDDA VREFH VREFL VSSA ADC1_SE16/CMP2_IN2/ADC0_SE22 ADC0_SE16/CMP1_IN2/ADC0_SE21
113
112
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36
VDD VSS PTC3 PTC2 PTC1 PTC0 PTB23 PTB22 PTB21 PTB20 PTB19 PTB18 PTB17 PTB16 VDD VSS PTB11 PTB10 PTB9 PTB8 PTB7 PTB6 PTB5 PTB4 PTB3 PTB2 PTB1 PTB0 PTA29 PTA28 PTA27 PTA26 PTA25 PTA24 RESET_b PTA19
107
EXTAL32
PTA1
PTA9
VBAT
PTA10
VSS
PTE24
DAC1_OUT/CMP2_IN3/ADC1_SE23
PTE28
PTA13
PTE25
DAC0_OUT/CMP1_IN3/ADC0_SE23
PTE27
PTA14
XTAL32
PTA16
PTA17
VREF_OUT/CMP1_IN5/ CMP0_IN5/ADC1_SE18
PTE26
PTA11
PTA12
Figure 28. K20 144 LQFP Pinout Diagram

Preliminary
PTA15
PTA18
PTA2
PTA5
PTA0
PTA6
PTA7
VDD
PTA8
VDD
PTA3
PTA4
VDD
VSS
VSS
71
Revision History
1 2 3 4 5 6 7 8 9 10 11 12
PTD7
PTD6
PTD5
PTD4
PTD0
PTC16
PTC12
PTC8
PTC4
NC
PTC3
PTC2
PTD12
PTD11
PTD10
PTD3
PTC19
PTC15
PTC11
PTC7
PTD9
NC
PTC1
PTC0
PTD15
PTD14
PTD13
PTD2
PTC18
PTC14
PTC10
PTC6
PTD8
NC
PTB23
PTB22
PTE2
PTE1
PTE0
PTD1
PTC17
PTC13
PTC9
PTC5
PTB21
PTB20
PTB19
PTB18
PTE6
PTE5
PTE4
PTE3
VDD
VDD
VDD
VDD
PTB17
PTB16
PTB11
PTB10
PTE10
PTE9
PTE8
PTE7
VDD
VSS
VSS
VDD
PTB9
PTB8
PTB7
PTB6
VOUT33
VREGIN
PTE12
PTE11
VREFH
VREFL
VSS
VSS
PTB5
PTB4
PTB3
PTB2
USB0_DP
USB0_DM
VSS
PTE28
VDDA
VSSA
VSS
VSS
PTB1
PTB0
PTA29
PTA28
ADC0_DP1
ADC0_DM1
ADC0_SE16 CMP1_IN2/ ADC0_SE21
PTE27
PTA0
PTA1
PTA6
PTA7
PTA13
PTA27
PTA26
PTA25
ADC1_DP1
ADC1_DM1
ADC1_SE16/ CMP2_IN2/ ADC0_SE22
PTE26
PTE25
PTA2
PTA3
PTA8
PTA12
PTA16
PTA17
PTA24
PGA0_DP/ ADC0_DP0/ ADC1_DP3
PGA0_DM/ ADC0_DM0/ ADC1_DM3
DAC0_OUT/ CMP1_IN3/ ADC0_SE23
DAC1_OUT/ CMP2_IN3/ ADC1_SE23
RESERVED
VBAT
PTA4
PTA9
PTA11
PTA14
PTA15
RESET_b
PGA1_DP/ M ADC1_DP0/ ADC0_DP3 1
PGA1_DM/ ADC1_DM0/ ADC0_DM3 2
VREF_OUT/ CMP1_IN5/ CMP0_IN5/ ADC1_SE18 3
PTE24
NC
EXTAL32
XTAL32
PTA5
PTA10
VSS
PTA19
PTA18
10
11
12
Figure 29. K20 144 MAPBGA Pinout Diagram
9 Revision History
The following table provides a revision history for this document.
Table 48. Revision History
Rev. No. 1 Date 11/2010 Substantial Changes Initial public revision Table continues on the next page...

72
Preliminary
Revision History
Table 48. Revision History (continued)

Rev. No. 2 3 4 Date 3/2011 3/2011 3/2011 Substantial Changes Many updates throughout Added sections that were inadvertently removed in previous revision Reworded IIC footnote in "Voltage and Current Operating Requirements" table. Added paragraph to "Peripheral operating requirements and behaviors" section. Added "JTAG full voltage range electricals" table to the "JTAG electricals" section. 5 6/2011 Changed supported part numbers per new part number scheme Changed DC injection current specs in "Voltage and current operating requirements" table Changed Input leakage current and internal pullup/pulldown resistor specs in "Voltage and current operating behaviors" table Split Low power stop mode current specs by temperature range in "Power consumption operating behaviors" table Changed typical IDD_VBAT spec in "Power consumption operating behaviors" table Added LPTMR clock specs to "Device clock specifications" table Changed Minimum external reset pulse width in "General switching specifications" table Changed PLL operating current in "MCG specifications" table Added footnote to PLL period jitter in "MCG specifications" table Changed Supply current in "Oscillator DC electrical specifications" table Changed Crystal startup time in "Oscillator frequency specifications" table Changed Operating voltage in "EzPort switching specifications" table Changed title of "FlexBus switching specifications" table and added Output valid and hold specs Added "FlexBus full range switching specifications" table Changed ADC asynchronous clock source specs in "16-bit ADC characteristics" table Changed Gain spec in "16-bit ADC with PGA characteristics" table Added typical Input DC current to "16-bit ADC with PGA characteristics" table Changed Input offset voltage and ENOB notes field in "16-bit ADC with PGA characteristics" table Changed Analog comparator initialization delay in "Comparator and 6-bit DAC electrical specifications" Changed Code-to-code settling time, DAC output voltage range low, and Temperature coefficient offset voltage in "12-bit DAC operating behaviors" table Changed Temperature drift and Load regulation in "VREF full-range operating behaviors" table Changed Regulator output voltage in "USB VREG electrical specifications" table Changed ILIM description and specs in "USB VREG electrical specifications" table Changed DSPI_SCK cycle time specs in "DSPI timing" tables Changed DSPI_SS specs in "Slave mode DSPI timing (low-speed mode)" table Changed DSPI_SCK to DSPI_SOUT valid spec in "Slave mode DSPI timing (highspeed mode)" table Changed Reference oscillator current source base current spec and added Lowpower current adder footer in "TSI electrical specifications" table

Preliminary
73
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Document Number: K20P144M100SF2 Rev. 5, 5/2011

Preliminary

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Freescale Semiconductor Data Sheet: Advance Information

Document Number: K20P144M100SF2 Rev. 5, 5/2011

Supports the following: MK20DX128ZVLQ10, MK20DX128ZVMD10, MK20DX256ZVLQ10, MK20DX256ZVMD10, MK20DN512ZVLQ10, MK20DN512ZVMD10

K20 Sub-Family Data Sheet

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

Freescale Semiconductor, Inc.

6.9 Human-machine interfaces (HMI)......................................62 6.9.1 TSI electrical specifications................................62

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

8.2 K20 Pinouts.......................................................................70

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

Freescale Semiconductor, Inc.

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

Temperature range (C) Package identifier

Maximum CPU frequency (MHz)

R = Tape and reel (Blank) = Trays

3 Terminology and guidelines

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

Freescale Semiconductor, Inc.

Terminology and guidelines

3.1 Definition: Operating requirement

3.2 Definition: Operating behavior

3.3 Definition: Attribute

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

Terminology and guidelines

3.4 Definition: Rating

3.5 Result of exceeding a rating

0 Operating rating Measured characteristic

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

Freescale Semiconductor, Inc.

Terminology and guidelines

3.6 Relationship between ratings and operating requirements

Limited operating range

Normal operating range

Limited operating range

3.7 Guidelines for ratings and operating requirements

3.8 Definition: Typical value

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

3.9 Typical value conditions

Freescale Semiconductor, Inc.

4.1 Thermal handling ratings

4.2 Moisture handling ratings

4.3 ESD handling ratings

4.4 Voltage and current operating ratings

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

0.7 VDD 0.75 VDD

0.06 VDD -5 Table continues on the next page...

0.35 VDD 0.3 VDD

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

Freescale Semiconductor, Inc.

Table 1. Voltage and current operating requirements (continued)

-25 1.2 TBD

5.1.2 LVD and POR operating requirements

Table continues on the next page...

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

Table 2. VDD supply LVD and POR operating requirements (continued)

1. Rising thresholds are falling threshold + hysteresis voltage

Table 3. VBAT power operating requirements

5.1.3 Voltage and current operating behaviors

Table continues on the next page...

K20 Sub-Family Data Sheet Data Sheet, Rev. 5, 5/2011.

Freescale Semiconductor, Inc.

Table 4. Voltage and current operating behaviors (continued)

5.1.4 Power mode transition operating behaviors