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Prof.V.Radhakrishnan
Measurement of Surfaces
Surface errors:
Form error: Deviation from the specified form. They can be considered as very long wave length irregularities. Example: A cylindrical surface having a taper. Medium wave length irregularities on the surface. Example: Surface errors having a wave length of 0.8 mm and above may be considered as waviness. Short wave length irregularities on the surface.
Waviness:
Roughness:
Measurement of Surfaces
Significance of Surface errors.
Form errors are deviations on the form of the part or the surface. A flat surface may have a slope on the surface or a large curvature. This error is to be within the tolerance specified on the part. Hence close toleranced parts should not have much form error. This can be checked by inspection of the part or by gauging. Form error normally covers surface wavelengths above 100mm.(Flatness measurement of a surface plate). Form deviations affect the assembly of parts, contact area between surfaces, surface distortions(Antenna surface). Form errors can be controlled well by using precision machine tools to produce them.
Measurement of Surfaces
Waviness of the surface covers medium wavelength irregularities. Wave lengths that are considered as waviness falls between 0.25 to 2.5 mm. In certain applications this range is extended on both sides. (0.08 to 8 mm). Waviness is generated on the surface by the manufacturing process and is often caused by the error in the guidance of the tool. In a lathe the guide way errors are reproduced on the part that is turned. The role of waviness is complex and covers variations in the contact areas between contacting surfaces, noise generation during relative motion between contacting surfaces (ball bearing), reflection of light, microwaves etc.
Measurement of Surfaces
Roughness has got very short wavelengths. These are below the wavelengths chosen for waviness. Hence depending on the selection of the waviness by the cut-off wave length used the roughness could increase or decrease for the same surface profile. Hence it is important to specify the cut-off used in roughness measurement. Roughness is significant for many surface related phenomena. These cover bearing area of a surface, friction between surfaces in relative motion , heat transfer , reflectivity, fluid flow, coating adhesion etc.
Measurement of Surfaces
Roughness is created by the process used to generate the surface. Like the cutting action of the tool in turning, grinding, milling, lapping etc. In fact these processes leave their marks on the surface and the direction of these visible marks is called the lay of the surface.
Surface Finish-Instrumentation
Stylus instruments Optical Instruments Scanning probe instruments
Stylus instruments
Diamond Stylus Radius 1.5 12 mm
2 D Surface
Stylus instruments take a surface section profile. This profile taken by the instrument is a distorted one as the vertical magnifications used are many times the horizontal ones used.
3D Surface
Filtering
Filters are used for separating waviness from roughness. By selecting the right cut-off value for the filter one can select the wave lengths that are to be removed as waviness. The sketch shows the effect of cut-off values on the filtered profiles.
Rk Value of Roughness
Specifying Roughness
Ra Value
Light Sectioning
Con-focal Microscope
Digital Measurements
Linear Measurements Angular Measurements Other Measurements
Digital readouts
Optical Scales
Moir`e Fringes
Incremental Scales
Resolver
Magnetic Scale
Inductosyn
Angular Measurements
Laser Scanner
Thus the digital data on a number of points on a part can be used for measuring many parameters like length, diameter, flatness, parallelism etc. This approach of measurement is known as coordinate metrology.
Coordinate Metrology
CMM
Elements of a CMM
Measurement frame work - CMM configuration Measuring Scales Digital scale Measuring Probe Discrete or continuous Contact or noncontact Provision for probe change Measurement software Provision for calibration
CMM Probes
Touch trigger probes Scanning probes Non-contact probes
Scanning Probe
Piezoelectric Probe
Combination Probe
Triangulation Probe
Substitute Elements
Substitute Elements
Types of CMMs
Nano-CMM
Optical CMM
Metrotomography
Measurement Technology of the Future
Laser Tracker
Laser Tracker
Polar coordination One length, two angles Low accuracy Accuracy is degraded when the target is far due to limited resolution of the rotary encoder.
d0
Laser Tracker
Laser Tracking
Laser trackers are based on the combination of two techniques: 1. A laser interferometer to measure relative distance, 2. Optical encoders to measure azimuth and elevation of the 3. Beam tracking
Principle of tracking
Laser Tracking
Principle of tracking
Laser Tracker